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For: Xu H, Youngblood KP, Huang H, Wu JJ, Moreno KA, Nikroo A, Shin SJ, Wang YM, Hamza AV. Characterization of Thin Copper Diffusion Barrier Layer in Beryllium Capsules. Fusion Science and Technology 2017. [DOI: 10.13182/fst13-tfm20-16] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
Number Cited by Other Article(s)
1
Youngblood KP, Huang H, Xu HW, Hayes J, Moreno KA, Wu JJ, Nikroo A, Alford CA, Hamza AV, Kucheyev SO, Wang YM, Wu KJ. Thin Oxides as a Copper Diffusion Barrier for NIF Beryllium Ablator Capsules. FUSION SCIENCE AND TECHNOLOGY 2017. [DOI: 10.13182/fst13-tfm20-23] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
2
Huang H, Xu HW, Youngblood KP, Wall DR, Stephens RB, Moreno KA, Nikroo A, Wu KJ, Wang M, Hamza AV. Inhomogeneous Copper Diffusion in NIF Beryllium Ablator Capsules. FUSION SCIENCE AND TECHNOLOGY 2017. [DOI: 10.13182/fst13-tfm20-24] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
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