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Song W, Li T, Wu S, Wang Z, Chen C, Chen Y, Huang C, Qiu K, Zhu S, Zou Y, Li T. Dispersionless Coupling among Optical Waveguides by Artificial Gauge Field. PHYSICAL REVIEW LETTERS 2022; 129:053901. [PMID: 35960569 DOI: 10.1103/physrevlett.129.053901] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/19/2022] [Revised: 02/13/2022] [Accepted: 06/14/2022] [Indexed: 06/15/2023]
Abstract
Coupling among closely packed waveguides is a common optical phenomenon, and plays an important role in optical routing and integration. Unfortunately, this coupling property is usually sensitive to the working wavelength and structure features that hinder the broadband and robust functions. Here, we report a new strategy utilizing an artificial gauge field (AGF) to engineer the coupling dispersion and realize a dispersionless coupling among waveguides with periodically bending modulation. The AGF-induced dispersionless coupling is experimentally verified in a silicon waveguide platform, which already has well-established broadband and robust routing functions (directional coupling and splitting), suggesting potential applications in integrated photonics. As examples, we further demonstrate a three-level-cascaded AGF waveguide network to route broadband light to desired ports with an overwhelming advantage over the conventional ones in comparison. Our method provides a new route of coupling dispersion control by AGF and benefits applications that fundamentally rely on waveguide coupling.
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Affiliation(s)
- Wange Song
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Ting Li
- School of Information Science and Technology, ShanghaiTech University, Shanghai 201210, China
| | - Shengjie Wu
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Zhizhang Wang
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Chen Chen
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Yuxin Chen
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Chunyu Huang
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Kai Qiu
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Shining Zhu
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
| | - Yi Zou
- School of Information Science and Technology, ShanghaiTech University, Shanghai 201210, China
| | - Tao Li
- National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Integration, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
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Yang L, Wang J, Yang LZ, Hu ZD, Wu X, Zheng G. Characteristics of multiple Fano resonances in waveguide-coupled surface plasmon resonance sensors based on waveguide theory. Sci Rep 2018; 8:2560. [PMID: 29416096 PMCID: PMC5803206 DOI: 10.1038/s41598-018-20952-7] [Citation(s) in RCA: 50] [Impact Index Per Article: 8.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/12/2017] [Accepted: 01/26/2018] [Indexed: 11/09/2022] Open
Abstract
We observe and analyze multiple Fano resonances and the plasmon-induced transparency (PIT) arising from waveguidecoupled surface plasmon resonance in a metal-dielectric Kretschmann configuration. It is shown that the simulation results for designed structures agree well with those of the dispersion relation of waveguide theory. We demonstrate that the coupling between the surface plasmon polariton mode and multi-order planar waveguide modes leads to multiple Fano resonances and PIT. The obtained results show that the number of Fano resonances and the linewidth of resonances depend on two structural parameters, the Parylene C and SiO2 layers, respectively. For the sensing action of Fano resonance, the figure of merit for the sensitivity by intensity is estimated to be 44 times higher than that of conventional surface plasmon resonance sensors. Our research reveals the potential advantage of sensors with high sensitivity based on coupling between the SPP mode and multi-order PWG modes.
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Affiliation(s)
- Liu Yang
- School of Science, Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology, Jiangnan University, Wuxi, 214122, China
| | - Jicheng Wang
- School of Science, Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology, Jiangnan University, Wuxi, 214122, China.
- State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, 210096, China.
| | - Li-Zhi Yang
- School of Science, Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology, Jiangnan University, Wuxi, 214122, China
| | - Zheng-Da Hu
- School of Science, Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology, Jiangnan University, Wuxi, 214122, China
| | - Xiaojun Wu
- School of IoT Engineering, Jiangnan University, 214122, Wuxi, China
| | - Gaige Zheng
- Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science and Technology, Nanjing, 210044, China
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Hewak DW, Lit JW. Generalized dispersion properties of a four-layer thin-film waveguide. APPLIED OPTICS 1987; 26:833-841. [PMID: 20454230 DOI: 10.1364/ao.26.000833] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
A general analytic expression is derived, which describes the dispersion properties of a four-layer thin-film optical waveguide. The formula describes the variation of the effective refractive index with respect to any physical parameter with which the refractive index of any layer or the thickness of the guiding layers may vary. Normalized parameters are used, and curves are presented which describe the contributions of the individual layers and waveguide geometry to the total dispersion. Uses of the formula are illustrated for the cases of temperature and wavelength dispersions. Results show that considerable control of the effective index of refraction is possible. Application to the control of chromatic dispersion in a thin-film Luneburg lens is also demonstrated.
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Chen CL, Kumarswami A. Nonreciprocal TM-mode thin-film phase shifters. APPLIED OPTICS 1986; 25:3664. [PMID: 18235675 DOI: 10.1364/ao.25.003664] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
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Hewak DW, Lit JW. Generalized dispersion properties of thin-film waveguides. APPLIED OPTICS 1986; 25:1977. [PMID: 18231444 DOI: 10.1364/ao.25.001977] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
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