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For: Sheffer D, Oppenheim UP, Clement D, Devir AD. Absolute reflectometer for the 0.8-2.5-microm region. Appl Opt 1987;26:583-586. [PMID: 20454174 DOI: 10.1364/ao.26.000583] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Number Cited by Other Article(s)
1
Gene J, Jeon MY, Lim SD. Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum. SENSORS 2021;21:s21041169. [PMID: 33562344 PMCID: PMC7914590 DOI: 10.3390/s21041169] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/30/2020] [Revised: 02/02/2021] [Accepted: 02/02/2021] [Indexed: 11/16/2022]
2
Marbach R, Heise HM. Optical diffuse reflectance accessory for measurements of skin tissue by near-infrared spectroscopy. APPLIED OPTICS 1995;34:610-21. [PMID: 20963158 DOI: 10.1364/ao.34.000610] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
3
Sheffer D, Oppenheim UP, Devir AD. Absolute measurements of diffuse reflectance in the alpha degrees /d configuration. APPLIED OPTICS 1991;30:3181-3185. [PMID: 20706372 DOI: 10.1364/ao.30.003181] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
4
Sheffer D, Oppenheim UP, Devir AD. Absolute reflectometer for the mid infrared region. APPLIED OPTICS 1990;29:129-132. [PMID: 20556077 DOI: 10.1364/ao.29.000129] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
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