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For: Keski-Kuha RA, Osantowski JF, Toft AR, Partlow WD. Grazing incidence reflectance of SiC films produced byplasma-assisted chemical vapor deposition. Appl Opt 1988;27:1499-1502. [PMID: 20531604 DOI: 10.1364/ao.27.001499] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Number Cited by Other Article(s)
1
Murano T, Koshiya S, Koike M, Hatano T, Pirozhkov AS, Kakio T, Hayashi N, Oue Y, Konishi K, Nagano T, Kondo K, Terauchi M. Laminar-type gratings overcoated with carbon-based materials to enhance analytical sensitivity of flat-field emission spectrograph in the VUV region. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2023;94:125113. [PMID: 38156956 DOI: 10.1063/5.0176783] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/16/2023] [Accepted: 12/04/2023] [Indexed: 01/03/2024]
2
Garoli D, Frassetto F, Monaco G, Nicolosi P, Pelizzo MG, Rigato F, Rigato V, Giglia A, Nannarone S. Reflectance measurements and optical constants in the extreme ultraviolet-vacuum ultraviolet regions for SiC with a different C/Si ratio. APPLIED OPTICS 2006;45:5642-50. [PMID: 16855662 DOI: 10.1364/ao.45.005642] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
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