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For: Takatsuji T, Oreb BF, Farrant DI, Tyrer JR. Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method. Appl Opt 1997;36:1438-1445. [PMID: 18250819 DOI: 10.1364/ao.36.001438] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Number Cited by Other Article(s)
1
Jiang H, Yang F, Dai X, He X, Peng G. Tri-wavelength simultaneous ESPI for 3D micro-deformation field measurement. APPLIED OPTICS 2022;61:615-622. [PMID: 35200904 DOI: 10.1364/ao.445824] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/12/2021] [Accepted: 12/11/2021] [Indexed: 06/14/2023]
2
Jiang H, Ma Y, Dai M, Dai X, Yang F, He X. Panoramic dual-directional shearography assisted by a bi-mirror. APPLIED OPTICS 2020;59:5812-5820. [PMID: 32609709 DOI: 10.1364/ao.394218] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/02/2020] [Accepted: 06/04/2020] [Indexed: 06/11/2023]
3
Online 3D Displacement Measurement Using Speckle Interferometer with a Single Illumination-Detection Path. SENSORS 2018;18:s18061923. [PMID: 29899279 PMCID: PMC6022172 DOI: 10.3390/s18061923] [Citation(s) in RCA: 13] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/15/2018] [Revised: 06/09/2018] [Accepted: 06/11/2018] [Indexed: 11/21/2022]
4
Sun P. Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry. APPLIED OPTICS 2007;46:2859-62. [PMID: 17514230 DOI: 10.1364/ao.46.002859] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/15/2023]
5
Flynn EB, Bassman LC, Smith TP, Lalji Z, Fullerton LH, Leung TC, Greenfield SR, Koskelo AC. Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions. APPLIED OPTICS 2006;45:3218-25. [PMID: 16676025 DOI: 10.1364/ao.45.003218] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/09/2023]
6
Farrant DI, Petzing JN. Sensitivity errors in interferometric deformation metrology. APPLIED OPTICS 2003;42:5634-5641. [PMID: 14528924 DOI: 10.1364/ao.42.005634] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
7
Farrant DI, Kaufmann GH, Petzing JN, Tyrer JR, Oreb BF, Kerr D. Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry. APPLIED OPTICS 1998;37:7259-7267. [PMID: 18301556 DOI: 10.1364/ao.37.007259] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
8
Fernández A, Blanco-García J, Doval AF, Bugarín J, Dorrío BV, López C, Alén JM, Pérez-Amor M, Fernández JL. Transient Deformation Measurement by Double-Pulsed-Subtraction TV Holography and the Fourier Transform Method. APPLIED OPTICS 1998;37:3440-3446. [PMID: 18273306 DOI: 10.1364/ao.37.003440] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
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