Arar B, Schiemangk M, Wenzel H, Brox O, Wicht A, Peters A, Tränkle G. Method for in-depth characterization of electro-optic phase modulators.
APPLIED OPTICS 2017;
56:1246-1252. [PMID:
28158141 DOI:
10.1364/ao.56.001246]
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Abstract
A flexible method to measure the modulation efficiency and residual amplitude modulation, including non-linearities, of phase modulators is presented. The method is based on demodulation of the modulated optical field in the optical domain by means of a heterodyne interferometer and subsequent analysis of the I&Q quadrature components of the corresponding RF beat note signal. As an example, we determine the phase modulation efficiency and residual amplitude modulation for both the TE and TM modes of a GaAs chip-based phase modulator at the wavelength of 1064 nm. From the results of these measurements, we estimate the linear and quadratic electro-optic coefficients for a P-p-n-N GaAs/AlGaAs double heterostructure.
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