Optical characterization of dielectric and semiconductor thin films by use of transmission data

High-Entropy Perovskite Thin Film in the Gd-Nd-Sm-La-Y-Co System: Deposition, Structure and Optoelectronic Properties

Multicomponent equimolar perovskite oxides (ME-POs) have recently emerged as a highly promising class of materials with unique synergistic effects, making them well-suited for applications in such areas as photovoltaics and micro- and nanoelectronics. High-entropy perovskite oxide thin film in the (Gd_0.2Nd_0.2La_0.2Sm_0.2Y_0.2)CoO₃ (RECO, where RE = Gd_0.2Nd_0.2La_0.2Sm_0.2Y_0.2, C = Co, and O = O₃) system was synthesized via pulsed laser deposition. The crystalline growth in an amorphous fused quartz substrate and single-phase composition of the synthesized film was confirmed by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Surface conductivity and activation energy were determined using a novel technique implementing atomic force microscopy (AFM) in combination with current mapping. The optoelectronic properties of the deposited RECO thin film were characterized using UV/VIS spectroscopy. The energy gap and nature of optical transitions were calculated using the Inverse Logarithmic Derivative (ILD) and four-point resistance method, suggesting direct allowed transitions with altered dispersions. The narrow energy gap of RECO, along with its relatively high absorption properties in the visible spectrum, positions it as a promising candidate for further exploration in the domains of low-energy infrared optics and electrocatalysis.

Determination of the optical constants of ligand-free organic lead halide perovskite quantum dots

Precise knowledge of the optical constants of perovskite lead halide quantum dots (QDs) is required to both understand their interaction with light and to rationally design and optimize the devices based on them. However, their determination from colloidal nanocrystal suspensions, or films made out of them, remains elusive, as a result of the difficulty in disentangling the optical constants of the organic capping ligands and those of the semiconductor itself. In this work, we extract the refractive index and extinction coefficient of ligand-free methylammonium lead iodide (MAPbI₃) and bromide (MAPbBr₃) nanocrystals. In order to prevent the use of organic ligands in the preparation, we follow a scaffold assisted synthetic procedure, which yields a composite film of high optical quality that can be independently and precisely characterized and modelled. In this way, the contribution of the guest nanocrystals can be successfully discriminated from that of the host matrix. Using a Kramers-Kronig consistent dispersion model along with an effective medium approximation, it is possible to derive the optical constants of the QDs by fitting the spectral dependence of light transmitted and reflected at different angles and polarizations. Our results indicate a strong dependence of the optical constants on the QD size. Small nanocrystals show remarkably large values of the extinction coefficient compared to their bulk counterparts. This analysis opens the door to the rigorous modelling of solar cells and light-emitting diodes with active layers based on perovskite QDs.

Argon and Other Defects in Amorphous SiO2 Coatings for Gravitational-Wave Detectors

Amorphous SiO2 thin films are one of the two components of the highly reflective mirror coatings of gravitational-wave detectors. For this study, layers of amorphous SiO2 on crystalline Si substrates were produced by ion-beam sputtering (IBS), using accelerated neutralized argon ions as sputtering particles, as is the case for the actual mirror coatings of gravitational-wave detectors. The aim of this study is to investigate the possible presence of various defects in the materials in order to improve the coating quality. We provide evidence that, due to the synthesis method, about 0.2 wt.% of Ar is present in the coatings, and it can be released by means of thermal treatments, starting around 400 °C. The time and temperature to obtain the total release of Ar increases with the coating thickness; for a thickness of 100 nm, all argon is released below 600 °C, while an isotherm of one hour at 900 °C is necessary for a coating 5 μm thick. Besides the Ar atoms left from the synthesis, other defects, such as Si clusters and silicon dangling bonds, are present in the coatings. The concentration of both of them is strongly reduced by thermal treatments either in vacuum or in air. The overall thickness of the coating is slightly increased after thermal treatments, as witnessed by the change of the period of interference fringes.

Spectral fitting method for obtaining the refractive index and thickness of chalcogenide films

Spectral fitting method (SFM) was proposed to obtain the refractive index (RI) and thickness of chalcogenide films based on transmission spectra. It extended the Swanepoel method to the films on the order of hundreds of nanometers in thickness. The RI and thickness of the films can be obtained quickly and accurately by using the SFM based on the transmission spectrum with only one peak and valley. The method's reliability theoretically was evaluated by simulation analysis. The results showed that the accuracy of the RI and thickness was better than 0.2% by using the SFM regardless of thin or thick film. Finally, the RI and thickness of the new ultralow loss reversible phase-change material Sb₂Se₃ films were obtained experimentally by the SFM. This work should provide a useful guideline for obtaining the RI and thickness of the transparent optical films.

Analysis of thickness influence on refractive index and absorption coefficient of zinc selenide thin films

Linear optical constants of thermally evaporated Zinc Selenide thin films are computed on the account of only transmittance experimental data. The refractive index and absorption coefficient dispersions of Zinc Selenide layers of small to close-to-bulk (50 nm ÷ 800 nm) thicknesses deposited on transparent quartz substrates are reckoned over a broad wavelength spectrum (300 nm ÷ 2500 nm). To distinct optical thickness classes, distinct analytical approach methods are implemented to compute the refractive index dispersions (Sellmeier equations) and absorption coefficient values, with the substrate's influence accounted for. The implemented methods are exploited to infer the linear optical constants for practically any thin film thickness, with the premise that all considered films are deposited by a same deposition method. Although different deposition methods may lead to different thickness dependencies of the linear optical constants (thin films of the same material having to be regarded accordingly to the deposition process), the implemented approach stays. The study substantiates the possibility and uplifts the importance of prior knowledge on thickness dependent linear optical constants to design thin film structures with particular, custom features for linear and nonlinear photonics applications.

Complex refractive index of polycarbonate over the UV-Vis-IR region from 0.2 to 3 μm

The complex refractive index dispersion of polycarbonate was identified from reflectance and transmittance measurements across the spectral range of 0.2-3 μm. Two identification methods were investigated. A numerical identification method that allows rigorous consideration of different experimental configurations is described. The results obtained are compared with values calculated with an analytical method assuming normal incidence.

Influence of substrate on the structure of predominantly anatase TiO2films grown by reactive sputtering

Revealing the crystalline structure of predominantly grown anatase TiO₂films.

Model-blind characterization of thin-film optical constants with momentum-resolved reflectometry

Determining optical constants of thin material films is important for characterizing their electronic excitations and for the design of optoelectronic devices. Spectroscopic ellipsometry techniques have emerged as the predominant approach for measuring thin-film optical constants. However, ellipsometry methods suffer from complications associated with highly model-dependent, multi-parameter spectral fitting procedures. Here, we present a model-blind, momentum-resolved reflectometry technique that yields accurate and precise optical constants, with quantifiable error estimates, even for film thicknesses less than 50 nm. These capabilities are demonstrated by interrogating an optical absorption resonance in films of the polymer P(NDI2OD-T2). We show that this approach produces exceptional agreement with UV-Vis-NIR absorption measurements, while simultaneously avoiding the need to construct complicated multi-oscillator spectral models. Finally, we use this procedure to resolve subtle differences in the out-of-plane optical properties of different film morphologies that were previously obscured in ellipsometry measurements.

Twin mirrors for laser interferometric gravitational-wave detectors

Gravitational-wave detectors such as Virgo and the laser interferometric gravitational-wave observatory (LIGO) use a long-baseline Michelson interferometer with Fabry-Perot cavities in the arms to search for gravitational waves. The symmetry between the two Fabry-Perot cavities is crucial to reduce the interferometer's sensitivity to the laser amplitude and frequency noise. To this purpose, the transmittance of the mirrors in both cavities should be as close as possible. This paper describes the realization and the characterization of the first twin large low-loss mirrors with transmissions differing by less than 0.01%.