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Krielaart MAR, Kruit P. Principles of electron wave front modulation with two miniature electron mirrors. Ultramicroscopy 2022; 233:113424. [PMID: 34864283 DOI: 10.1016/j.ultramic.2021.113424] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/28/2021] [Revised: 10/19/2021] [Accepted: 10/31/2021] [Indexed: 10/19/2022]
Abstract
We have analyzed the possibilities of wave front shaping with miniature patterned electron mirrors through the WKB approximation. Based on this, we propose a microscopy scheme that uses two miniature electron mirrors on an auxiliary optical axis that is in parallel with the microscope axis. A design for this microscopy scheme is presented for which the two axes can be spatially separated by as little as 1 mm. We first provide a mathematical relationship between the electric potential and the accumulated phase modulation of the reflected electron wave front using the WKB approximation. Next, we derive the electric field in front of the mirror, as a function of a topographic or pixel wise excited mirror pattern. With this, we can relate the effect of a mirror pattern onto the near-field phase, or far field intensity distribution and use this to provide a first optical insight into the functioning of the patterned mirror. The equations can only be applied numerically, for which we provide a description of the relevant numerical methods. Finally, these methods are applied to find mirror patterns for controlled beam diffraction efficiency, beam mode conversion, and an arbitrary phase and amplitude distribution. The successful realization of the proposed methods would enable arbitrary shaping of the wave front without electron-matter interaction, and hence we coin the term virtual phase plate for this design. The design may also enable the experimental realization of a Mach-Zehnder interferometer for electrons, as well as interaction-free measurements of radiation sensitive specimen.
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Affiliation(s)
- M A R Krielaart
- Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Physics, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
| | - P Kruit
- Delft University of Technology, Faculty of Applied Sciences, Department of Imaging Physics, Lorentzweg 1, 2628 CJ Delft, The Netherlands
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Schachinger T, Hartel P, Lu PH, Löffler S, Obermair M, Dries M, Gerthsen D, Dunin-Borkowski RE, Schattschneider P. Experimental realization of a π/2 vortex mode converter for electrons using a spherical aberration corrector. Ultramicroscopy 2021; 229:113340. [PMID: 34311124 DOI: 10.1016/j.ultramic.2021.113340] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/15/2021] [Revised: 05/18/2021] [Accepted: 06/10/2021] [Indexed: 10/21/2022]
Abstract
In light optics, beams with orbital angular momentum (OAM) can be produced by employing a properly-tuned two-cylinder-lens arrangement, also called π/2 mode converter. It is not possible to convey this concept directly to the beam in an electron microscope due to the non-existence of cylinder lenses in commercial transmission electron microscopes (TEMs). A viable work-around are readily-available electron optical elements in the form of quadrupole lenses. In a proof-of-principle experiment in 2012, it has been shown that a single quadrupole in combination with a Hilbert phase-plate produces a spatially-confined, transient vortex mode. Here, an analogue to an optical π/2 mode converter is realized by repurposing a CEOS DCOR probe corrector in an aberration corrected TEM in a way that it resembles a dual cylinder lens using two quadrupoles. In order to verify the presence of OAM in the output beam, a fork dislocation grating is used as an OAM analyser. The possibility to use magnetic quadrupole fields instead of, e.g., prefabricated fork dislocation gratings to produce electron beams carrying OAM enhances the beam brightness by almost an order of magnitude and delivers switchable high-mode purity vortex beams without unwanted side-bands.
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Affiliation(s)
- T Schachinger
- Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria.
| | - P Hartel
- CEOS Corrected Electron Optical Systems GmbH, Englerstraße 28, 69126 Heidelberg, Germany
| | - P-H Lu
- Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany; RWTH Aachen University, Ahornstraße 55, 52074 Aachen, Germany
| | - S Löffler
- University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
| | - M Obermair
- Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
| | - M Dries
- Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
| | - D Gerthsen
- Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
| | - R E Dunin-Borkowski
- Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
| | - P Schattschneider
- Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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Turner AE, Johnson CW, Kruit P, McMorran BJ. Interaction-Free Measurement with Electrons. PHYSICAL REVIEW LETTERS 2021; 127:110401. [PMID: 34558944 DOI: 10.1103/physrevlett.127.110401] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/14/2021] [Revised: 05/18/2021] [Accepted: 07/14/2021] [Indexed: 06/13/2023]
Abstract
Here, we experimentally demonstrate interaction-free measurements with electrons using a novel electron Mach-Zehnder interferometer. The flexible two-grating electron interferometer is constructed in a conventional transmission electron microscope and achieves high contrast in discrete output detectors, tunable alignment with independently movable beam splitters, and scanning capabilities for imaging. With this path-separated electron interferometer, which closely matches theoretical expectations, we demonstrate electron interaction-free measurements with an efficiency of 14±1%. Implementing this quantum protocol in electron imaging opens a path toward interaction-free electron microscopy.
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Affiliation(s)
- Amy E Turner
- Department of Physics, University of Oregon, Eugene, Oregon 97403, USA
| | - Cameron W Johnson
- Department of Physics, University of Oregon, Eugene, Oregon 97403, USA
| | - Pieter Kruit
- Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft, Netherlands
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Uesugi Y, Fukushima R, Kozawa Y, Sato S. Ultrafast laser ablation of 10-nm self-supporting membranes by two-beam interference processing. OPTICS EXPRESS 2020; 28:26200-26206. [PMID: 32906896 DOI: 10.1364/oe.400941] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/23/2020] [Accepted: 08/13/2020] [Indexed: 06/11/2023]
Abstract
Ultrafast laser ablation was applied to process 10-nm self-supporting membranes. The membranes were processed over tens of square micrometers by single-shot irradiation of two visible laser pulses, followed by the realization of periodic sub-microstructures. The fabricated geometry is dependent on the intensity distribution of the superposed input pulses, providing flexibility and facilitating practical micro- and nanoengineering. Ease of designing the processing parameters and speed of processing are the significant advantages of this method compared to focused ion beam (FIB) milling.
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Johnson CW, Pierce JS, Moraski RC, Turner AE, Greenberg AT, Parker WS, McMorran BJ. Exact design of complex amplitude holograms for producing arbitrary scalar fields. OPTICS EXPRESS 2020; 28:17334-17346. [PMID: 32679943 DOI: 10.1364/oe.393224] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/25/2020] [Accepted: 05/16/2020] [Indexed: 06/11/2023]
Abstract
Typical methods to holographically encode arbitrary wavefronts assume the hologram medium only applies either phase shifts or amplitude attenuation to the wavefront. In many cases, phase cannot be introduced to the wavefront without also affecting the amplitude. Here we show how to encode an arbitrary wavefront into an off-axis transmission hologram that returns the exact desired arbitrary wavefunction in a diffracted beam for phase-only, amplitude-only, or mixed phase and amplitude holograms with any periodic groove profile. We apply this to design thin holograms for electrons in a TEM, but our results are generally applicable to light and X-ray optics. We employ a phase reconstruction from a series of focal plane images to qualitatively show the accuracy of this method to impart the expected amplitude and phase to a specific diffraction order.
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