Multifrequency grating projection profilometry based on the nonlinear excess fraction method

Phase-Shifting Projected Fringe Profilometry Using Binary-Encoded Patterns

A phase unwrapping method for phase-shifting projected fringe profilometry is presented. It did not require additional projections to identify the fringe orders. The pattern used for the phase extraction could be used for phase unwrapping directly. By spatially encoding the fringe patterns that were used to perform the phase-shifting technique with binary contrasts, fringe orders could be discerned. For spatially isolated objects or surfaces with large depth discontinuities, unwrapping could be identified without ambiguity. Even though the surface color or reflectivity varied periodically with position, it distinguished the fringe order very well.

Photorefractive moiré-like patterns for the multifringe projection method in Fourier transform profilometry

In the present paper, the method of simultaneous moiré-like fringe pattern projection for Fourier transform profilometry is described. The photorefractive holographic interferometric process produces controlled moiré-like patterns with two or more different variation directions. Each low spatial frequency fringe pattern is experimentally obtained as a result of the superposition of two high spatial frequency sinusoidal gratings, with slightly different pitches, for each fringe variation direction. These dynamic moiré-like patterns are induced due to an optical holographic beating of the sinusoidal induced gratings in the volume of the photorefractive Bi₁₂TiO₂₀ (BTO) crystal sample used as dynamic holographic medium. Two or more moiré-like fringe patterns, with at least two different variation directions, simultaneously (or not), are projected onto the object surface. Thus, this is the 2D fringe projection stage of our proposed Fourier transform procedure to determine the profile of a simple object.

Three-dimensional trace measurements for fast-moving objects using binary-encoded fringe projection techniques

A fringe projection technique to trace the shape of a fast-moving object is proposed. A binary-encoded fringe pattern is illuminated by a strobe lamp and then projected onto the moving object at a sequence of time. Phases of the projected fringes obtained from the sequent measurements are extracted by the Fourier transform method. Unwrapping is then performed with reference to the binary-encoded fringe pattern. Even though the inspected object is colorful, fringe orders can be identified. A stream of profiles is therefore retrieved from the sequent unwrapped phases. This makes it possible to analyze physical properties of the dynamic objects. Advantages of the binary-encoded fringe pattern for phase unwrapping also include (1) reliable performance for colorful objects, spatially isolated objects, and surfaces with large depth discontinuities; (2) unwrapped errors only confined in a local area; and (3) low computation cost.

Subpixelic measurement of large 1D displacements: principle, processing algorithms, performances and software

This paper presents a visual measurement method able to sense 1D rigid body displacements with very high resolutions, large ranges and high processing rates. Sub-pixelic resolution is obtained thanks to a structured pattern placed on the target. The pattern is made of twin periodic grids with slightly different periods. The periodic frames are suited for Fourier-like phase calculations—leading to high resolution—while the period difference allows the removal of phase ambiguity and thus a high range-to-resolution ratio. The paper presents the measurement principle as well as the processing algorithms (source files are provided as supplementary materials). The theoretical and experimental performances are also discussed. The processing time is around 3 μs for a line of 780 pixels, which means that the measurement rate is mostly limited by the image acquisition frame rate. A 3-σ repeatability of 5 nm is experimentally demonstrated which has to be compared with the 168 μm measurement range.

Method of excess fractions with application to absolute distance metrology: theoretical analysis

The method of excess fractions (EF) is well established to resolve the fringe order ambiguity generated in interferometric detection. Despite this background, multiwavelength interferometric absolute long distance measurements have only been reported with varying degrees of success. In this paper we present a theoretical model that can predict the unambiguous measurement range in EF based on the selected measurement wavelengths and phase noise. It is shown that beat wavelength solutions are a subset of this theoretical model. The performance of EF, for a given phase noise, is shown to be equivalent to beat techniques but offers many alternative sets of measurement wavelengths and therefore EF offer significantly greater flexibility in experimental design.

A novel encoded-phase technique for phase measuring profilometry

Three-dimensional (3-D) shape measurement using a novel encoded-phase grating is proposed. The projected sinusoidal fringe patterns are designed with wrapped and encoded phase instead of monotonic and unwrapped phase. Phase values of the projected fringes on the surface are evaluated by phase-shift technique. The absolute phase is then restored with reference to the encoded information, which is extracted from the differential of the wrapped phase. To solve the phase errors at some phase-jump areas, Hilbert transform is employed. By embedding the encoded information in the wrapped phase, there is no extra pattern that needs to be projected. The experimental results identify its feasibility and show the possibility to measure the spatially isolated objects. It will be promising to analyze dynamic objects.

High-speed and dense three-dimensional surface acquisition using defocused binary patterns for spatially isolated objects

The three-dimensional (3-D) shape measurement using defocused Ronchi grating is advantageous for the high contrast of fringe. This paper presents a method for measuring spatially isolated objects using defocused binary patterns. Two Ronchi grating with horizontal position difference of one-third of a period and an encoded pattern are adopted. The phase distribution of fringe pattern is obtained by Fourier analysis method. The measurement depth and range is enlarged because the third harmonic component and background illumination is eliminated with proposed method. The fringe order is identified by the encoded pattern. Three gray levels are used and the pattern is converted to binary image with error diffusion algorithm. The tolerance of encoded pattern is large. It is suited for defocused optical system. We also present a measurement system with a modified DLP projector and a high-speed camera. The 3-D surface acquisition speed of 60 frames per second (fps), with resolution of 640 × 480 points and that of 120 fps, with resolution of 320 × 240 points are archived. If the control logic of DMD was modified and a camera with higher speed was employed, the measurement speed would reach thousands fps. This makes it possible to analyze dynamic objects.

Analysis and identification of phase error in phase measuring profilometry

Both the analysis of phase errors which occur at the abrupt discontinuities in phase measuring profilometry (PMP) and the identification method are presented in this paper. The sampling effect of CCD will cause a dilution of accuracy in PMP, especially at abrupt discontinuities on the object surface. The existing methods cannot efficiently identify the abrupt discontinuities. We analyze the relationship between the phase, the height and the equivalent wavelength. By viewing the phase as the argument of a vector we find out that CCD sampling introduces errors into the measurement and the phase is nonlinear to the equivalent wavelength at the abrupt discontinuities. Therefore temporal phase unwrapping (TPU) is introduced into the measurement to identify the abrupt discontinuities. Computer simulations and practical experiment validate the feasibility of this method.

Fringe projection with a sinusoidal phase grating

Phase-shifting profilometry requires projection of sinusoidal fringes on a 3D object. We analyze the visibility and frequency content of fringes created by a sinusoidal phase grating at coherent illumination. We derive an expression for the intensity of fringes in the Fresnel zone and measure their visibility and frequency content for a grating that has been interferometrically recorded on a holographic plate. Both evaluation of the systematic errors due to the presence of higher harmonics by simulation of a profilometric measurement and measurement of 3D coordinates of test objects confirm the good performance of the sinusoidal phase grating as a projective element. In addition, we prove theoretically that in comparison with a sinusoidal amplitude grating this grating produces better quality of fringes in the near-infrared region. Sinusoidal phase gratings are fabricated easily, and their implementation in fringe projection profilometry facilitates construction of portable, small size, and low-cost devices.

Three-dimensional profilometry using a Dammann grating

We propose three-dimensional (3D) profilometry based on a Fourier transform in which a two-dimensional (2D) Dammann grating and a cylindrical lens are used to generate structured light. The Dammann grating splits most of the illumination power into a 2D diffractive spot matrix. The cylindrical lens transforms these 2D diffractive spots into one-dimensional fringe lines that are projected on an object. The produced projection fringes have the advantages of high brightness and high contrast and compression ratios. The experiments have verified the proposed 3D profilometry. The 3D profilometry using Dammann grating should be of high interest for practical applications.

Two-dimensional phase-measuring profilometry

An improved method is proposed to perform contouring of an object based on phase-measuring profilometry with a grid grating. Two phases unwrapped in perpendicular directions are obtained with the help of an adaptive bandpass filter and are used to unwrap the phases and to appoint the edge points of a shaded area and the object area. The height distribution of the object is obtained with the geometric relationship between coordinates and phases. The main axis of the projector and the main axis of the camera are not crossed and are also not in the same plane in order to arrange a measuring system easily and conveniently. The experimental results show that this technique is available for practical applications.

Phase-unwrapping algorithm based on frequency analysis for measurement of a complex object by the phase-measuring-profilometry method

A new phase-unwrapping algorithm based on fringe frequency analysis is presented that will achieve greater automation and precision in measuring complex objects by phase-measuring profilometry (PMP). The new algorithm, which combines digital weighted filtering in the frequency domain and modulation ordering in the spatial domain, can recognize corrupt pixels automatically and produce a better phase-unwrapping path. By frequency weighted filtering, the analysis of fringe frequency is converted into the analysis of fringe modulation. Then, based on a strong correlation between local spatial frequency and the reliability of phase data, ordering of the filtered modulation produces an optimized unwrapping path. Simulation and experiments verify the new algorithm.

Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry

Sinusoidal structured illumination is used widely in three-dimensional (3-D) sensing and machine vision. Phase algorithms, for example, in phase-measuring profilometry, are inherently free of errors only with perfect sinusoidal fringe projection. But it is difficult to produce a perfect sinusoidal grating. We propose a new concept, area modulation, to improve the sinusoidality of structured illumination. A binary-coded picture is made up of many micrometer units. An aperture is open in every micrometer unit, and its area is determined by the value of the sinusoidal function. When such a grating is projected onto an object surface, the image of the grating becomes sinusoidal because of the convolution function of an optical system. We have designed and manufactured an area modulation grating for sinusoidal structure illumination using a large-scale integration technique. The area modulation grating has been used in the high-precision phase-measuring profilometry system, and the phase errors caused by the area modulation grating are reduced to 0.1%. The grating guaranteed the entire measuring accuracy to a 1% equivalent wavelength. The experimental results proved that area modulation grating would be of significant help in improving the phase-measurement accuracy of the 3-D sensing system.