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For: Xian T, Su X. Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry. Appl Opt 2001;40:1201-1206. [PMID: 18357106 DOI: 10.1364/ao.40.001201] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
Number Cited by Other Article(s)
1
Peng R, Zhou G, Zhang C, Wei C, Wang X, Chen X, Yang L, Yue H, Liu Y. Ultra-small, low-cost, and simple-to-control PSP projector based on SLCD technology. OPTICS EXPRESS 2024;32:1878-1889. [PMID: 38297730 DOI: 10.1364/oe.500702] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/17/2023] [Accepted: 10/31/2023] [Indexed: 02/02/2024]
2
Zhou P, Feng X, Luo J, Zhu J. Temporal-spatial binary encoding method based on dynamic threshold optimization for 3D shape measurement. OPTICS EXPRESS 2023;31:23274-23293. [PMID: 37475416 DOI: 10.1364/oe.493903] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/24/2023] [Accepted: 06/14/2023] [Indexed: 07/22/2023]
3
Chu C, Wei Y, Wang H. Improved 3D Pavement Texture Reconstruction Method Based on Interference Fringe via Optimizing the Post-Processing Method. SENSORS (BASEL, SWITZERLAND) 2023;23:4660. [PMID: 37430574 DOI: 10.3390/s23104660] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/21/2023] [Revised: 05/05/2023] [Accepted: 05/09/2023] [Indexed: 07/12/2023]
4
Zhu S, Cao Y, Zhang Q, Wang Y. High-efficiency and robust binary fringe optimization for superfast 3D shape measurement. OPTICS EXPRESS 2022;30:35539-35553. [PMID: 36258503 DOI: 10.1364/oe.472642] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/08/2022] [Accepted: 09/04/2022] [Indexed: 06/16/2023]
5
Liu Y, Zhang Q, Liu Y, Yu X, Hou Y, Chen W. High-speed 3D shape measurement using a rotary mechanical projector. OPTICS EXPRESS 2021;29:7885-7903. [PMID: 33726281 DOI: 10.1364/oe.419206] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/07/2021] [Accepted: 02/17/2021] [Indexed: 06/12/2023]
6
Wang L, Cao Y, Li C, Wan Y, Li H, Xu C, Zhang H. Improved computer-generated moiré profilometry with flat image calibration. APPLIED OPTICS 2021;60:1209-1216. [PMID: 33690552 DOI: 10.1364/ao.412291] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/14/2020] [Accepted: 01/05/2021] [Indexed: 06/12/2023]
7
Marrugo AG, Gao F, Zhang S. State-of-the-art active optical techniques for three-dimensional surface metrology: a review [Invited]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION 2020;37:B60-B77. [PMID: 32902422 DOI: 10.1364/josaa.398644] [Citation(s) in RCA: 51] [Impact Index Per Article: 12.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/27/2020] [Accepted: 07/07/2020] [Indexed: 05/27/2023]
8
Multi-Field Interference Simultaneously Imaging on Single Image for Dynamic Surface Measurement. SENSORS 2020;20:s20123372. [PMID: 32549210 PMCID: PMC7349715 DOI: 10.3390/s20123372] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/19/2020] [Revised: 06/10/2020] [Accepted: 06/11/2020] [Indexed: 11/16/2022]
9
Han W, Gao X, Fan Z, Bai L, Liu B. Long Exposure Short Pulse Synchronous Phase Lock Method for Capturing High Dynamic Surface Shape. SENSORS 2020;20:s20092550. [PMID: 32365797 PMCID: PMC7249036 DOI: 10.3390/s20092550] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/14/2020] [Revised: 04/25/2020] [Accepted: 04/27/2020] [Indexed: 11/21/2022]
10
Zhang J, Luo B, Su X, Wang Y, Chen X, Wang Y. Depth range enhancement of binary defocusing technique based on multi-frequency phase merging. OPTICS EXPRESS 2019;27:36717-36730. [PMID: 31873445 DOI: 10.1364/oe.27.036717] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/31/2019] [Accepted: 10/26/2019] [Indexed: 06/10/2023]
11
Wang Y, Jiang C, Zhang S. Double-pattern triangular pulse width modulation technique for high-accuracy high-speed 3D shape measurement. OPTICS EXPRESS 2017;25:30177-30188. [PMID: 29221050 DOI: 10.1364/oe.25.030177] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/09/2017] [Accepted: 11/09/2017] [Indexed: 06/07/2023]
12
He X, Fu X, Rao X, Fu F. Nondestructive determination of optical properties of a pear using spatial frequency domain imaging combined with phase-measuring profilometry. APPLIED OPTICS 2017;56:8207-8215. [PMID: 29047685 DOI: 10.1364/ao.56.008207] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/30/2017] [Accepted: 09/07/2017] [Indexed: 06/07/2023]
13
An Y, Zhang S. Three-dimensional absolute shape measurement by combining binary statistical pattern matching with phase-shifting methods. APPLIED OPTICS 2017;56:5418-5426. [PMID: 29047499 DOI: 10.1364/ao.56.005418] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/08/2017] [Accepted: 06/01/2017] [Indexed: 06/07/2023]
14
Lohry W, Zhang S. Genetic method to optimize binary dithering technique for high-quality fringe generation. OPTICS LETTERS 2013;38:540-542. [PMID: 23455129 DOI: 10.1364/ol.38.000540] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
15
Wang Y, Zhang S. Three-dimensional shape measurement with binary dithered patterns. APPLIED OPTICS 2012;51:6631-6636. [PMID: 23033035 DOI: 10.1364/ao.51.006631] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/23/2012] [Accepted: 08/25/2012] [Indexed: 06/01/2023]
16
Rosendahl S, Hällstig E, Gren P, Sjödahl M. Phase errors due to speckles in laser fringe projection. APPLIED OPTICS 2010;49:2047-2053. [PMID: 20390003 DOI: 10.1364/ao.49.002047] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
17
Stoykova E, Minchev G, Sainov V. Fringe projection with a sinusoidal phase grating. APPLIED OPTICS 2009;48:4774-4784. [PMID: 19696868 DOI: 10.1364/ao.48.004774] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
18
Yen HN, Tsai DM, Feng SK. Full-Field 3-D Flip-Chip Solder Bumps Measurement Using DLP-Based Phase Shifting Technique. ACTA ACUST UNITED AC 2008. [DOI: 10.1109/tadvp.2008.2005015] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
19
Rajoub BA, Lalor MJ, Burton DR, Karout SA. A new model for measuring object shape using non-collimated fringe-pattern projections. ACTA ACUST UNITED AC 2007. [DOI: 10.1088/1464-4258/9/6/s10] [Citation(s) in RCA: 22] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
20
Yen HN, Tsai DM, Yang JY. Full-Field 3-D Measurement of Solder Pastes Using LCD-Based Phase Shifting Techniques. ACTA ACUST UNITED AC 2006. [DOI: 10.1109/tepm.2005.862632] [Citation(s) in RCA: 33] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
21
Zheng RH, Wang YX, Zhang XR, Song YL. Two-dimensional phase-measuring profilometry. APPLIED OPTICS 2005;44:954-958. [PMID: 15751685 DOI: 10.1364/ao.44.000954] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
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