Parallel optical-path-length-shifting digital holography

Pixel Resolution Imaging in Parallel Phase-Shifting Digital Holography

Parallel phase-shifting digital holography (PPSDH) employing a polarization image sensor can suppress zero-order and twin-image noise through a single exposure, achieve instantaneous measurement of complex-valued dynamic objects, and have broad applications in the areas of biomedicine, etc. To improve the imaging resolution of PPSDH, we propose an oversampled super-pixel image reconstruction method, which can be expressed as the implementation of nearest-neighbor interpolation to replace blank pixels in sparse sub-phase-shift holograms. We found experimentally that the maximum spatial lateral resolution of the reconstructed image based on the existing super-pixel method, B-spline, bicubic, bilinear, and the proposed nearest-neighbor interpolation was 12.4 µm, 11.4 µm, 9.8 µm, 8.8 µm, and 7.8 µm, respectively. The main reason for not reaching the ideal value of 6.9 µm was the inherent residual zero-order and twin-image noise, which needs to be removed in the future.

Height measurement of solder bumps using two-wavelength parallel four-step phase shifting digital holography

Digital holography (DH) with two wavelengths (TW) that are close to each other was applied to height measurement of solder bumps having spherical specular surfaces with diameters of ∼20µm and heights of ∼20µm. We employed the parallel phase shifting method for instantaneous image capturing, and we improved the spatial resolution of our TW-DH system having two beams with different wavelengths that traveled in opposite directions in the interferometer. It gave 74-times higher repetition and 2.4-times higher spatial resolution than those in our previous DH system based on the Fourier transform method.

Optical thickness measurement with single-shot dual-wavelength in-line digital holography

An algorithm for quantitative reconstruction of the optical thickness distribution of objects is proposed based on single-shot dual-wavelength in-line digital holography. Two single-wavelength holograms can be extracted from a single-shot recorded dual-wavelength in-line hologram. The quantitative optical thickness distribution of the specimen can be reconstructed directly without calculations of the phase images at every single wavelength. Thus, off-axis recording and phase-shifting operation are not required, enabling a fast and high-resolution measurement. The effectiveness and accuracy of the proposed method are verified by both numerical simulations and experimental results.

Advanced Nanomeasuring Techniques for Surface Characterization

Advanced precise and accurate nanomeasurement techniques play an important role to improve the function and quality of surface characterization. There are two basic approaches, the hard measuring techniques and the soft computing measuring techniques. The advanced soft measuring techniques include coordinate measuring machines, roundness testing facilities, surface roughness, interferometric methods, confocal optical microscopy, scanning probe microscopy, and computed tomography at the level of nanometer scale. On the other hand, a new technical committee in ISO is established to address characterization issues posed by the areal surface texture and measurement methods. This paper reviews the major advanced soft metrology techniques obtained by optical, tactile, and other means using instruments, classification schemes of them, and their applications in the engineering surfaces. Furthermore, future trends under development in this area are presented and discussed to display proposed solutions for the important issues that need to be addressed scientifically.

Digital holographic profilometry of the inner surface of a pipe using a current-induced wavelength change of a laser diode

Phase-shifting digital holography is applied to the measurement of the surface profile of the inner surface of a pipe for the detection of a hole in its wall. For surface contouring of the inner wall, a two-wavelength method involving an injection-current-induced wavelength change of a laser diode is used. To illuminate and obtain information on the inner surface, a cone-shaped mirror is set inside the pipe and moved along in a longitudinal direction. The distribution of a calculated optical path length in an experimental alignment is used to compensate for the distortion due to the misalignment of the mirror in the pipe. Using the proposed method, two pieces of metal sheet pasted on the inner wall of the pipe and a hole in the wall are detected. This shows that the three-dimensional profile of a metal plate on the inner wall of a pipe can be measured using simple image processing.

Single-exposure phase-shifting digital holography using a random-phase reference wave

We propose a single-exposure phase-shifting digital holography based on a wave-splitting method using a random-phase reference wave. A random-phase reference wave gives random-phase distribution on the digital hologram. Using the amplitude and the phase distributions of the reference wave, the fully complex amplitude of the object wave is obtained. The proposed method requires not devised optical systems but ordinary imaging devices, such as CCD cameras. A preliminary experimental result is given to confirm the proposed method.