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For: Kašalynas I, Venckevičius R, Tumonis L, Voisiat B, Seliuta D, Valušis G, Račiukaitis G. Reflective terahertz imaging with the TEM01 mode laser beam. Appl Opt 2013;52:5640-5644. [PMID: 23938412 DOI: 10.1364/ao.52.005640] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/18/2013] [Accepted: 06/23/2013] [Indexed: 06/02/2023]
Number Cited by Other Article(s)
1
Yang L, Jing S. Viewing resolution and depth-of-field enhancement for a digital 3D display based on neural network-enabled multilayer view perspective fitting. APPLIED OPTICS 2024;63:3317-3325. [PMID: 38856483 DOI: 10.1364/ao.519680] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/22/2024] [Accepted: 03/29/2024] [Indexed: 06/11/2024]
2
Qi L, Minkevičius L, Urbanowicz A, Švigelj A, Grigelionis I, Kašalynas I, Trontelj J, Valušis G. Antenna-Coupled Titanium Microbolometers: Application for Precise Control of Radiation Patterns in Terahertz Time-Domain Systems. SENSORS 2021;21:s21103510. [PMID: 34070029 PMCID: PMC8158144 DOI: 10.3390/s21103510] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/16/2021] [Revised: 05/12/2021] [Accepted: 05/14/2021] [Indexed: 11/16/2022]
3
Titanium-Based Microbolometers: Control of Spatial Profile of Terahertz Emission in Weak Power Sources. APPLIED SCIENCES-BASEL 2020. [DOI: 10.3390/app10103400] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/31/2022]
4
Minkevičius L, Indrišiūnas S, Šniaukas R, Voisiat B, Janonis V, Tamošiūnas V, Kašalynas I, Račiukaitis G, Valušis G. Terahertz multilevel phase Fresnel lenses fabricated by laser patterning of silicon. OPTICS LETTERS 2017;42:1875-1878. [PMID: 28504748 DOI: 10.1364/ol.42.001875] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
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