Parallelized genetic optimization of spatial light modulator addressing for diffractive applications

Measuring the spatial deformation of a liquid-crystal on silicon display with a self-interference effect

We present a simple technique to characterize the spatial non-uniformity of a liquid-crystal on silicon (LCOS) spatial light modulator (SLM). It is based on illuminating the display with a wavelength out of the operation range, so there is a significant reflection at the output surface. As a consequence, a Gires-Tournois interferometer is directly created, without any alignment requirement and insensitive to vibrations. The beam reflected at the output surface is the reference beam, while the beam reflected at the silicon backplane is modulated with the addressed gray level in order to quantitatively derive its deformation. We provide an experimental demonstration using a LCOS-SLM designed to operate in the near-infrared range but illuminated with visible light.

Calibration of a phase-only spatial light modulator for both phase and retardance modulation

Liquid crystal spatial light modulators (SLMs) are usually configured and calibrated for phase modulation. However, as they are variable retarders, they also have application as polarization modulators. We show that conventional phase-only calibrations are insufficient for this purpose, and a separate retardance calibration is needed. To overcome this shortcoming we report a simple Twyman-Green interferometer-based setup to realize SLM phase and retardance calibration. For phase calibration, we identify the non-linear, spatially variant response to the drive voltage of the SLM using fringe analysis and both horizontally and vertically polarized incident light. For retardance calibration, we use incident light polarized at 45° and assess the intensity variation. The methods presented are compatible with in situ calibration of SLMs.