Resolution enhancement of the microscopic imaging by unknown sinusoidal structured illumination with iterative algorithm

Interference illumination of three nonzero-order beams for LCOS-based structured illumination microscopy

To avoid the need for a mask and polarisation-adjusting devices, and to solve the problem of low fringe contrast caused by the reflected light along with 0th-order diffraction beam, this paper presents an illumination method using three nonzero-order diffraction beams in liquid crystal on silicon (LCOS)-based structured illumination microscopy. Here, a LCOS-based spatial light modulator (SLM) is used to diffract the collimated light and a rotating frosted film is used to reduce the spatial coherence of the laser; then, the fringe is produced by adjusting the SLM angle to allow three nonzero-order diffraction beams to interfere on the sample surface. Interference fringes with high contrast in all directions can be obtained without considering polarisation control and the removal of the 0th-order diffraction beam, which demonstrates that the optical setup is simple and easy to control. We carried out experiments on a photolithographic pattern on a silicon chip, and the resolution after reconstruction is 210 nm, reaching the theoretical resolution at our experiment condition and nearly half of the Rayleigh resolution limit (100× objective, NA = 0.8), which is 406 nm. LAY DESCRIPTION: SIM has been widely applied in imaging of biological sample owing to its advantage of super-resolution. Commonly the structured illumination is produced by interfering two or three diffractive beams and the fringe contrast affects the reconstruction result directly. In this study about liquid-crystal-on-silicon based structured illumination microscopy (LCOS-based SIM), we presents an illumination method using three nonzero-order diffractive beams. Our method can avoid the need for a mask and the polarisation-adjusting devices, because three-beam interference can reduce the influence of polarisation on the fringe contrast. Besides, 0th-order beam is not used, because reflected light still exists even the grey level of the picture-pixels uploaded to spatial light modulator are all 0, which means the 0th-order beam will bring obvious noise. Using our method, interference fringe with high contrast in all directions can be obtained at a relatively high utilisation rate of laser intensity without considering the control of polarisation. Our setup is simple and easy to control, because the adjustment of the deflection angle of the spatial light modulator can realise the removal of the zero diffraction order. We have analysed and discussed the reasons why the interference of three nonzero-order beams can avoid the influence of polarisation and amplitude. The experiments carried out on a photolithographic pattern on silicon chip showed that the resolution after reconstruction is 210 nm, reaching the half of the Rayleigh resolution limit (100× objective, NA=0.8), which is 406 nm.

Structured illumination imaging without grating rotation based on mirror operation on 1D Fourier spectrum

Structured illumination microscopy (SIM) is a rapidly developing a super-resolution optical microscopy technique. With SIM, the grating is needed in order to rotate several angles for illuminating the sample in different directions. Multiple rotations reduce the imaging speed and grating rotation angle errors damage the image recovery quality. We introduce mirror transformation on one-dimension (1D) Fourier spectrum to SIM for resolving the problems of low imaging speed and severe impact on image reconstruction quality by grating rotation angle errors. When mirror operation and SIM are combined, the grating is placed at an orientation for obtaining three shadow images. The three shadow images are acquired by CCD at three different phase shift for a direction of grating. Thus, the SIM imaging speed is faster and the effect on image reconstruction quality by grating rotation angle errors is greatly reduced.

Digital Holography and 3D Imaging: introduction to the joint feature issue in Applied Optics and Journal of the Optical Society of America B

The OSA Topical Meeting on Digital Holography and 3D Imaging (DH) was held 25-28 July 2016 in Heidelberg, Germany, as part of the Imaging Congress. Feature issues based on the DH meeting series have been released by Applied Optics (AO) since 2007. This year, AO and the Journal of the Optical Society of America B (JOSA B) jointly decided to have one such feature issue in each journal. This feature issue includes 31 papers in AO and 11 in JOSA B, and covers a large range of topics, reflecting the rapidly expanding techniques and applications of digital holography and 3D imaging. The upcoming DH meeting (DH 2017) will be held from 29 May to 1 June in Jeju Island, South Korea.