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Li P, Fu C, Zhong H, Du B, Guo K, Meng Y, Du C, He J, Wang L, Wang Y. A Nondestructive Measurement Method of Optical Fiber Young's Modulus Based on OFDR. SENSORS 2022; 22:s22041450. [PMID: 35214352 PMCID: PMC8878550 DOI: 10.3390/s22041450] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/29/2022] [Revised: 02/11/2022] [Accepted: 02/11/2022] [Indexed: 11/16/2022]
Abstract
A nondestructive measurement method based on an Optical frequency domain reflectometry (OFDR) was demonstrated to achieve Young’s modulus of an optical fiber. Such a method can be used to measure, not only the averaged Young’s modulus within the measured fiber length, but also Young’s modulus distribution along the optical fiber axis. Moreover, the standard deviation of the measured Young’s modulus is calculated to analyze the measurement error. Young’s modulus distribution of the coated and uncoated single mode fiber (SMF) samples was successfully measured along the optical fiber axis. The average Young’s modulus of the coated and uncoated SMF samples was 13.75 ± 0.14, and 71.63 ± 0.43 Gpa, respectively, within the measured fiber length of 500 mm. The measured Young’s modulus distribution along the optical fiber axis could be used to analyze the damage degree of the fiber, which is very useful to nondestructively estimate the service life of optical fiber sensors immersed into smart engineer structures.
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Affiliation(s)
- Pengfei Li
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Cailing Fu
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
- Correspondence:
| | - Huajian Zhong
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Bin Du
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Kuikui Guo
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Yanjie Meng
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Chao Du
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Jun He
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
| | - Lei Wang
- Shenzhen Key Laboratory of Polymer Science and Technology, College of Materials Science and Engineering, Shenzhen University, Shenzhen 518055, China;
| | - Yiping Wang
- Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China; (P.L.); (H.Z.); (B.D.); (K.G.); (Y.M.); (C.D.); (J.H.); (Y.W.)
- Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China
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el-Diasty F, el-Hennawi HA. Nonlinearity in bent optical fibers. APPLIED OPTICS 2009; 48:3818-3822. [PMID: 19571941 DOI: 10.1364/ao.48.003818] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
An interferometric method to study the induced variations of nonlinear parameters in bent optical fiber such as third-order susceptibility chi((3)) and second-order refractive index n(2) is presented. Due to the expected nonlinear response of the Young's modulus of fiber material, the profiles of asymmetric variations of the two parameters with curvature are observed and calculated, revealing the high spatial and index resolution of the method. The investigation is done in single-mode optical fibers at the standard operating wavelengths of 1300 and 1550 nm and at radii of curvature from 5 to 11 mm. At the minimum radius of curvature R=5 mm, the cladding chi((3))=4.131x10(-15) esu on the tensile side, whereas on the compressed side it is 4.601x10(-15) esu for lambda=1300 nm. On the tensile side n(2)=1.09x10(-13) esu, whereas on the compressed side it is 1.216x10(-13) esu. For lambda=1550 nm, the cladding chi((3)) and n(2) on the tensile side are 3.96x10(-15) esu and 1.055x10(-13) esu, whereas in the compressed cladding side they are 4.435x10(-15) esu and 1.174x10(-13) esu, respectively. At lambda=1300 nm and R=5 mm, the core chi((3)) is given by 4.631x10(-15) esu on the tensile side and 4.649x10(-15) esu on the compressed side. The asymmetry in n(2) is given by 1.223x10(-13) esu on the tensile side and by 1.227x10(-13) esu on the compressed side. With lambda=1550 nm, the core chi((3)) asymmetry is given by 4.46x10(-15) esu on the tensile side and by 4.477x10(-15) esu on the compressed side. For n(2) its asymmetry is provided by 1.181x10(-13) esu on the tensile side and by 1.185x10(-13) esu on the compressed side.
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Affiliation(s)
- Fouad el-Diasty
- Department of Physics, Faculty of Science, Ain Shams University, Abbasia Cairo 11566, Egypt.
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El-Diasty F. Evaluation of some GRIN fiber parameters and the associated fraction mode loss due to mechanically induced optical anisotropy. APPLIED OPTICS 2003; 42:5263-5273. [PMID: 14503694 DOI: 10.1364/ao.42.005263] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Abstract
Some of the optical parameters of the bent multimode graded-index (GRIN) optical fiber in terms of indices of refraction, where the bending stresses broke the radial symmetry, are evaluated by use of multiple-beam Fizeau fringes. The variation of the index difference between the cladding index and core index in both the compression and tensile fiber regions is measured. The accuracy of measuring the index is +/- 1 x 10(-4). The spatial resolution of the method is 1.39 microm. Evaluation of the acceptance angle, the numerical aperture, and the V number profiles of the bent fiber from the interference pattern at both sides of the bent fiber are presented. The fraction of the mode number lost has been evaluated. The method was used to study the influence of compression on diminishing the index difference that leads to a dissipation of energy and a considerable mode loss. It is obvious from the experimental data that the change of the index difference due to bending strongly affects the fraction of propagating mode number, especially at the small radii of curvature. Ignoring the variation of the index difference we evaluating the number of propagated modes number leads to an insufficient determination of the mode loss. It subsequently leads to an incorrect determination of the mode dispersion and the interface loss in bent GRIN fibers. The study confirms that the deviation of the guide axis from straightness with the radius of curvature of less than 1 cm could lead to a significant fraction mode loss.
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Affiliation(s)
- Fouad El-Diasty
- Department of Physics, Faculty of Science, Ain Shams University, Abbassia, Cairo 11566, Egypt.
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