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For: Marrugo AG, Gao F, Zhang S. State-of-the-art active optical techniques for three-dimensional surface metrology: a review [Invited]. J Opt Soc Am A Opt Image Sci Vis 2020;37:B60-B77. [PMID: 32902422 DOI: 10.1364/josaa.398644] [Citation(s) in RCA: 51] [Impact Index Per Article: 12.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/27/2020] [Accepted: 07/07/2020] [Indexed: 05/27/2023]
Number Cited by Other Article(s)
1
Yao P, Chen Y, Gai S, Da F. Accurate 3D Measurement of Complex Texture Objects by Height Compensation Using a Dual-Projector Structure. IEEE TRANSACTIONS ON IMAGE PROCESSING : A PUBLICATION OF THE IEEE SIGNAL PROCESSING SOCIETY 2024;33:3021-3030. [PMID: 38648148 DOI: 10.1109/tip.2024.3389609] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/25/2024]
2
Bag D, Chakraborty S, Sinha A. Nanoscale surface metrology with a liquid crystal-based phase-shifting angular shearing interferometer. OPTICS LETTERS 2024;49:1705-1708. [PMID: 38560842 DOI: 10.1364/ol.514441] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/30/2023] [Accepted: 02/26/2024] [Indexed: 04/04/2024]
3
Vilar N, Artigas R, Duocastella M, Carles G. Fast topographic optical imaging using encoded search focal scan. Nat Commun 2024;15:2065. [PMID: 38453926 PMCID: PMC10920621 DOI: 10.1038/s41467-024-46267-y] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/14/2023] [Accepted: 02/21/2024] [Indexed: 03/09/2024]  Open
4
Liu B, Wang C, Wang S, Wu G. Color crosstalk compensation method for color phase-shifting fringe projection profilometry based on the phase correction matrix. OPTICS EXPRESS 2024;32:5793-5808. [PMID: 38439297 DOI: 10.1364/oe.514014] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/22/2023] [Accepted: 01/21/2024] [Indexed: 03/06/2024]
5
Hao Q, Lin C, Hu Y, Yu Q, Lv J, Zheng C, Zhang S, Xu C, Song C. Dual-wavelength Fourier ptychographic microscopy for topographic measurement. OPTICS EXPRESS 2024;32:6684-6699. [PMID: 38439366 DOI: 10.1364/oe.516874] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/22/2023] [Accepted: 01/30/2024] [Indexed: 03/06/2024]
6
Wu Z, Tao W, Lv N, Zhao H. Optimization of parameters for a fringe projection measurement system by use of an improved differential evolution method. OPTICS EXPRESS 2024;32:3632-3646. [PMID: 38297580 DOI: 10.1364/oe.507602] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2023] [Accepted: 12/04/2023] [Indexed: 02/02/2024]
7
Wu Z, Li A, Xue R, Hu M, Song Y. High-precision surface profilometry on a micron-groove based on dual-comb electronically controlled optical sampling. APPLIED OPTICS 2023;62:8793-8797. [PMID: 38038025 DOI: 10.1364/ao.503753] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/23/2023] [Accepted: 10/25/2023] [Indexed: 12/02/2023]
8
Narayan SK, Pandey D, Vithin AVS, Gannavarpu R. Robust method to process nonuniform intensity holograms in digital holographic microscopy for nanoscale surface metrology. APPLIED OPTICS 2023;62:8497-8505. [PMID: 38037962 DOI: 10.1364/ao.502828] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/09/2023] [Accepted: 10/11/2023] [Indexed: 12/02/2023]
9
Wisniewski HJ, Stalcup TE, Smythe RA, Olszak AG. Interferometric metrology probe for highly sloped freeform optics. APPLIED OPTICS 2023;62:8482-8490. [PMID: 38037960 DOI: 10.1364/ao.500553] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/14/2023] [Accepted: 10/13/2023] [Indexed: 12/02/2023]
10
Lu S, Weng H, Dai M, Zhang B, Xu Z, Gu H, Liu Y, Li Y, Peng K. Dynamic 3D phase-shifting profilometry based on a corner optical flow algorithm. APPLIED OPTICS 2023;62:6447-6455. [PMID: 37706838 DOI: 10.1364/ao.494119] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/27/2023] [Accepted: 08/06/2023] [Indexed: 09/15/2023]
11
Liu N, Huang Z, He Z, Cao L. DGE-CNN: 2D-to-3D holographic display based on a depth gradient extracting module and ZCNN network. OPTICS EXPRESS 2023;31:23867-23876. [PMID: 37475227 DOI: 10.1364/oe.489639] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/09/2023] [Accepted: 06/20/2023] [Indexed: 07/22/2023]
12
Lyu N, Yu H, Xu X, Bai L, Zheng D, Han J. Structured light 3-D sensing for scenes with discontinuous reflectivity: error removal based on scene reconstruction and normalization. OPTICS EXPRESS 2023;31:20134-20149. [PMID: 37381414 DOI: 10.1364/oe.490206] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/21/2023] [Accepted: 05/08/2023] [Indexed: 06/30/2023]
13
Sánchez-Arriaga NE, Tiwari D, Hutabarat W, Leyland A, Tiwari A. A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing. SENSORS (BASEL, SWITZERLAND) 2023;23:s23115326. [PMID: 37300053 DOI: 10.3390/s23115326] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/07/2023] [Revised: 05/30/2023] [Accepted: 05/31/2023] [Indexed: 06/12/2023]
14
Vargas R, Romero LA, Zhang S, Marrugo AG. Pixel-wise rational model for a structured light system. OPTICS LETTERS 2023;48:2712-2715. [PMID: 37186747 DOI: 10.1364/ol.492911] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/17/2023]
15
Zhang S. Flexible structured light system calibration method with all digital features. OPTICS EXPRESS 2023;31:17076-17086. [PMID: 37157771 DOI: 10.1364/oe.490189] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
16
Mazzocato S, Daffara C. A Method for Spatially Registered Microprofilometry Combining Intensity-Height Datasets from Interferometric Sensors. SENSORS (BASEL, SWITZERLAND) 2023;23:4144. [PMID: 37112485 PMCID: PMC10146856 DOI: 10.3390/s23084144] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/11/2023] [Revised: 04/02/2023] [Accepted: 04/15/2023] [Indexed: 06/19/2023]
17
Wang H, Zhu J, Sung J, Hu G, Greene J, Li Y, Park S, Kim W, Lee M, Yang Y, Tian L. Fourier ptychographic topography. OPTICS EXPRESS 2023;31:11007-11018. [PMID: 37155746 DOI: 10.1364/oe.481712] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
18
Cheng X, Xu S, Liu Y, Cao Y, Xie H, Ye J. Development of an Optoelectronic Integrated Sensor for a MEMS Mirror-Based Active Structured Light System. MICROMACHINES 2023;14:561. [PMID: 36984968 PMCID: PMC10051696 DOI: 10.3390/mi14030561] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/28/2022] [Revised: 02/19/2023] [Accepted: 02/23/2023] [Indexed: 06/18/2023]
19
Zhao B, Li J, Mao X, Sun F, Gao X. Dynamic pressure surface deformation measurement based on a chromatic confocal sensor. APPLIED OPTICS 2023;62:1467-1474. [PMID: 36821306 DOI: 10.1364/ao.482808] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/05/2022] [Accepted: 01/17/2023] [Indexed: 06/18/2023]
20
Chang C, Dai B, Zhu D, Li J, Xia J, Zhang D, Hou L, Zhuang S. From picture to 3D hologram: end-to-end learning of real-time 3D photorealistic hologram generation from 2D image input. OPTICS LETTERS 2023;48:851-854. [PMID: 36790957 DOI: 10.1364/ol.478976] [Citation(s) in RCA: 4] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/21/2022] [Accepted: 12/17/2022] [Indexed: 06/18/2023]
21
Han L, Yu L, Zhu X. A Novel Method for Pose and Position Calibration of Laser Displacement Sensors. SENSORS (BASEL, SWITZERLAND) 2023;23:1762. [PMID: 36850356 PMCID: PMC9965569 DOI: 10.3390/s23041762] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/31/2022] [Revised: 01/27/2023] [Accepted: 02/01/2023] [Indexed: 06/18/2023]
22
Zhao C, Xiao H, Zhao Z, Wang G. Prediction and Optimization Algorithm for Intersection Point of Spatial Multi-Lines Based on Photogrammetry. SENSORS (BASEL, SWITZERLAND) 2022;22:9821. [PMID: 36560189 PMCID: PMC9785157 DOI: 10.3390/s22249821] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/21/2022] [Revised: 12/08/2022] [Accepted: 12/12/2022] [Indexed: 06/17/2023]
23
Liu J, Tian P, Li H, Wei H, Deng G, Zhou S, Ma Z, Wang W, He L. An Improved Synthesis Phase Unwrapping Method Based on Three-Frequency Heterodyne. SENSORS (BASEL, SWITZERLAND) 2022;22:9388. [PMID: 36502089 PMCID: PMC9738266 DOI: 10.3390/s22239388] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/14/2022] [Revised: 11/14/2022] [Accepted: 11/30/2022] [Indexed: 06/17/2023]
24
Yang D, Gao T, Lu F. Optical three-dimensional shape measurement based on structured light and a binocular vision system. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION 2022;39:2009-2015. [PMID: 36520697 DOI: 10.1364/josaa.472660] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/10/2022] [Accepted: 09/27/2022] [Indexed: 06/17/2023]
25
Chen X, Zhang J, Xi J. 3D Metrology Using One Camera with Rotating Anamorphic Lenses. SENSORS (BASEL, SWITZERLAND) 2022;22:8407. [PMID: 36366104 PMCID: PMC9656777 DOI: 10.3390/s22218407] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/05/2022] [Revised: 10/26/2022] [Accepted: 10/31/2022] [Indexed: 06/16/2023]
26
Zhang S. Pixel-wise structured light calibration method with a color calibration target. OPTICS EXPRESS 2022;30:35817-35827. [PMID: 36258524 DOI: 10.1364/oe.463423] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/10/2022] [Accepted: 09/08/2022] [Indexed: 06/16/2023]
27
Lv S, Tang D, Zhang X, Yang D, Deng W, Kemao Q. Fringe projection profilometry method with high efficiency, precision, and convenience: theoretical analysis and development. OPTICS EXPRESS 2022;30:33515-33537. [PMID: 36242386 DOI: 10.1364/oe.467502] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/10/2022] [Accepted: 08/16/2022] [Indexed: 06/16/2023]
28
Daffara C, Mazzocato S. Surface Metrology Based on Scanning Conoscopic Holography for In Situ and In-Process Monitoring of Microtexture in Paintings. SENSORS (BASEL, SWITZERLAND) 2022;22:s22176637. [PMID: 36081095 PMCID: PMC9460557 DOI: 10.3390/s22176637] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2022] [Revised: 08/23/2022] [Accepted: 08/30/2022] [Indexed: 05/14/2023]
29
Wu Z, Guo W, Zhang Q, Wang H, Li X, Chen Z. Time-overlapping structured-light projection: high performance on 3D shape measurement for complex dynamic scenes. OPTICS EXPRESS 2022;30:22467-22486. [PMID: 36224944 DOI: 10.1364/oe.460088] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/01/2022] [Accepted: 05/26/2022] [Indexed: 06/16/2023]
30
Özcan B, Blankenbach J. Quality Assessment of a Novel Camera-Based Measurement System for Roughness Determination of Concrete Surfaces-Accuracy Evaluation and Validation. SENSORS 2022;22:s22114211. [PMID: 35684832 PMCID: PMC9185533 DOI: 10.3390/s22114211] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/28/2022] [Revised: 05/18/2022] [Accepted: 05/25/2022] [Indexed: 12/04/2022]
31
Wu C, Yang L, Luo Z, Jiang W. Linear Laser Scanning Measurement Method Tracking by a Binocular Vision. SENSORS 2022;22:s22093572. [PMID: 35591259 PMCID: PMC9100134 DOI: 10.3390/s22093572] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/09/2022] [Revised: 04/28/2022] [Accepted: 05/05/2022] [Indexed: 12/04/2022]
32
Chang C, Zhu D, Li J, Wang D, Xia J, Zhang X. Three-dimensional computer holography enabled from a single 2D image. OPTICS LETTERS 2022;47:2202-2205. [PMID: 35486760 DOI: 10.1364/ol.452488] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/04/2022] [Accepted: 03/19/2022] [Indexed: 06/14/2023]
33
Wang S, Hou Y, Liu X, Hao Q. Calibration method for parabolic reflector measurement by using reverse Hartmann test. APPLIED OPTICS 2022;61:1001-1011. [PMID: 35201067 DOI: 10.1364/ao.446001] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/15/2021] [Accepted: 01/01/2022] [Indexed: 06/14/2023]
34
The degradation and simultaneous influence of bisphenol A on methane production in a bio-anode single-chamber microbial electrolysis cell. Biochem Eng J 2021. [DOI: 10.1016/j.bej.2021.108219] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
35
Zhao Q, Tang C, Min X, Lei Z. Dynamic shape measurement for objects with patterns by Fourier fringe projection profilometry based on variational decomposition and multi-scale Retinex. APPLIED OPTICS 2021;60:10322-10331. [PMID: 34807040 DOI: 10.1364/ao.438992] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/28/2021] [Accepted: 10/20/2021] [Indexed: 06/13/2023]
36
Miao Y, Yang Y, Hou Q, Wang Z, Liu X, Tang Q, Peng X, Gao BZ. High-efficiency 3D reconstruction with a uniaxial MEMS-based fringe projection profilometry. OPTICS EXPRESS 2021;29:34243-34257. [PMID: 34809219 DOI: 10.1364/oe.441564] [Citation(s) in RCA: 12] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/26/2021] [Accepted: 09/25/2021] [Indexed: 06/13/2023]
37
Li J, Zheng Y, Liu L, Li B. 4D line-scan hyperspectral imaging. OPTICS EXPRESS 2021;29:34835-34849. [PMID: 34809264 DOI: 10.1364/oe.441213] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/22/2021] [Accepted: 10/04/2021] [Indexed: 06/13/2023]
38
A super-grayscale and real-time computer-generated Moiré profilometry using video grating projection. Sci Rep 2021;11:19882. [PMID: 34615976 PMCID: PMC8494878 DOI: 10.1038/s41598-021-99420-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/24/2021] [Accepted: 09/20/2021] [Indexed: 11/28/2022]  Open
39
Wang Y, Zhao H, Jiang H, Li X, Li Y, Xu Y. Paraxial 3D shape measurement using parallel single-pixel imaging. OPTICS EXPRESS 2021;29:30543-30557. [PMID: 34614777 DOI: 10.1364/oe.435470] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/29/2021] [Accepted: 08/24/2021] [Indexed: 06/13/2023]
40
Teir L, Lindstedt T, Widmaier T, Hemming B, Brand U, Fahrbach M, Peiner E, Lassila A. In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes. SENSORS 2021;21:s21175955. [PMID: 34502846 PMCID: PMC8434642 DOI: 10.3390/s21175955] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/16/2021] [Revised: 08/19/2021] [Accepted: 08/23/2021] [Indexed: 01/17/2023]
41
3D Measurement of Structured Specular Surfaces Using Stereo Direct Phase Measurement Deflectometry. MACHINES 2021. [DOI: 10.3390/machines9080170] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
42
Shi Y, Chang C, Liu X, Gao N, Meng Z, Zhang Z. Infrared phase measuring deflectometry by using defocused binary fringe. OPTICS LETTERS 2021;46:3091-3094. [PMID: 34197388 DOI: 10.1364/ol.431044] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/11/2021] [Accepted: 06/08/2021] [Indexed: 06/13/2023]
43
Phase Demodulation Method for Fringe Projection Measurement Based on Improved Variable-Frequency Coded Patterns. SENSORS 2021;21:s21134463. [PMID: 34210041 PMCID: PMC8271525 DOI: 10.3390/s21134463] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/08/2021] [Revised: 06/19/2021] [Accepted: 06/24/2021] [Indexed: 11/16/2022]
44
Wang Y, Wang C, Cai J, Xi D, Chen X, Wang Y. Improved spatial-shifting two-wavelength algorithm for 3D shape measurement with a look-up table. APPLIED OPTICS 2021;60:4878-4884. [PMID: 34143049 DOI: 10.1364/ao.425084] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/15/2021] [Accepted: 05/07/2021] [Indexed: 06/12/2023]
45
Marrugo AG, Vargas R, Romero LA, Zhang S. Method for large-scale structured-light system calibration. OPTICS EXPRESS 2021;29:17316-17329. [PMID: 34154277 DOI: 10.1364/oe.422327] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/09/2021] [Accepted: 05/17/2021] [Indexed: 06/13/2023]
46
Engay E, Huo D, Malureanu R, Bunea AI, Lavrinenko A. Polarization-Dependent All-Dielectric Metasurface for Single-Shot Quantitative Phase Imaging. NANO LETTERS 2021;21:3820-3826. [PMID: 33886339 DOI: 10.1021/acs.nanolett.1c00190] [Citation(s) in RCA: 11] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
47
Adapted Fringe Projection Sequences for Changing Illumination Conditions on the Example of Measuring a Wrought-Hot Object Influenced by Forced Cooling. SENSORS 2021;21:s21051599. [PMID: 33668803 PMCID: PMC7956746 DOI: 10.3390/s21051599] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/22/2020] [Revised: 02/15/2021] [Accepted: 02/22/2021] [Indexed: 11/17/2022]
48
Data-Driven Intelligent 3D Surface Measurement in Smart Manufacturing: Review and Outlook. MACHINES 2021. [DOI: 10.3390/machines9010013] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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High-Accuracy 3-D Sensor for Rivet Inspection Using Fringe Projection Profilometry with Texture Constraint. SENSORS 2020;20:s20247270. [PMID: 33352954 PMCID: PMC7766055 DOI: 10.3390/s20247270] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/11/2020] [Revised: 12/13/2020] [Accepted: 12/16/2020] [Indexed: 11/17/2022]
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Lu Z, Cai L. Calibration method for the electrically tunable lens based on shape-changing polymer. OPTICS EXPRESS 2020;28:31140-31162. [PMID: 33115095 DOI: 10.1364/oe.403249] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/23/2020] [Accepted: 09/03/2020] [Indexed: 06/11/2023]
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