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For: Xu J, Li Y, Wang H, Chai L, Xu Q. Phase-shift extraction for phase-shifting interferometry by histogram of phase difference. Opt Express 2010;18:24368-24378. [PMID: 21164784 DOI: 10.1364/oe.18.024368] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Number Cited by Other Article(s)
1
Ahmad A, Dubey V, Butola A, Tinguely JC, Ahluwalia BS, Mehta DS. Sub-nanometer height sensitivity by phase shifting interference microscopy under environmental fluctuations. OPTICS EXPRESS 2020;28:9340-9358. [PMID: 32225543 DOI: 10.1364/oe.384259] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/12/2023]
2
Cheng Z, Liu D. Universal phase reconstruction approach of self-calibrating phase-shifting interferometry. OPTICS LETTERS 2019;44:3857-3860. [PMID: 31368986 DOI: 10.1364/ol.44.003857] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/03/2019] [Accepted: 06/24/2019] [Indexed: 06/10/2023]
3
Tian C, Liu S. Phase retrieval in two-shot phase-shifting interferometry based on phase shift estimation in a local mask. OPTICS EXPRESS 2017;25:21673-21683. [PMID: 29041462 DOI: 10.1364/oe.25.021673] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/26/2017] [Accepted: 08/03/2017] [Indexed: 06/07/2023]
4
Liu F, Wu Y, Wu F. Phase shifting interferometry from two normalized interferograms with random tilt phase-shift. OPTICS EXPRESS 2015;23:19932-19946. [PMID: 26367653 DOI: 10.1364/oe.23.019932] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
5
Chang CY, Lin SH, Ma CC. High-resolution electronic interferometry for the measurement of in-plane vibration. APPLIED OPTICS 2012;51:5773-5779. [PMID: 22907002 DOI: 10.1364/ao.51.005773] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/30/2012] [Accepted: 06/29/2012] [Indexed: 06/01/2023]
6
Xu J, Jin W, Chai L, Xu Q. Phase extraction from randomly phase-shifted interferograms by combining principal component analysis and least squares method. OPTICS EXPRESS 2011;19:20483-20492. [PMID: 21997056 DOI: 10.1364/oe.19.020483] [Citation(s) in RCA: 32] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
7
Xu J, Sun L, Li Y, Li Y. Principal component analysis of multiple-beam Fizeau interferograms with random phase shifts. OPTICS EXPRESS 2011;19:14464-14472. [PMID: 21934808 DOI: 10.1364/oe.19.014464] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
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