Eschen W, Tadesse G, Peng Y, Steinert M, Pertsch T, Limpert J, Rothhardt J. Single-shot characterization of strongly focused coherent XUV and soft X-ray beams.
OPTICS LETTERS 2020;
45:4798-4801. [PMID:
32870860 DOI:
10.1364/ol.394445]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/06/2020] [Accepted: 07/29/2020] [Indexed: 06/11/2023]
Abstract
In this Letter, we present a novel, to the best of our knowledge, single-shot method for characterizing focused coherent beams. We utilize a dedicated amplitude-only mask, in combination with an iterative phase retrieval algorithm, to reconstruct the amplitude and phase of a focused beam from a single measured far-field diffraction pattern alone. In a proof-of-principle experiment at a wavelength of 13.5 nm, we demonstrate our new method and obtain an RMS phase error of better than λ/70. This method will find applications in the alignment of complex optical systems, real-time feedback to adaptive optics, and single-shot beam characterization, e.g., at free-electron lasers or high-order harmonic beamlines.
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