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For: Mehrotra P, Mack CA, Blaikie RJ. A detailed study of resonance-assisted evanescent interference lithography to create high aspect ratio, super-resolved structures. Opt Express 2013;21:13710-13725. [PMID: 23736624 DOI: 10.1364/oe.21.013710] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Number Cited by Other Article(s)
1
Ji J, Xu P, Lin Z, Chen J, Li J, Meng Y. Application of the Metal Reflector for Redistributing the Focusing Intensity of SPPs. NANOMATERIALS 2020;10:nano10050937. [PMID: 32413982 PMCID: PMC7279234 DOI: 10.3390/nano10050937] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/20/2020] [Revised: 04/23/2020] [Accepted: 05/04/2020] [Indexed: 11/16/2022]
2
Masui S, Torii Y, Michihata M, Takamasu K, Takahashi S. Fabrication of nano/micro dual-periodic structures by multi-beam evanescent wave interference lithography using spatial beats. OPTICS EXPRESS 2019;27:31522-31531. [PMID: 31684386 DOI: 10.1364/oe.27.031522] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/14/2019] [Accepted: 10/07/2019] [Indexed: 06/10/2023]
3
Bourke L, Blaikie RJ. Herpin effective media resonant underlayers and resonant overlayer designs for ultra-high NA interference lithography. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION 2017;34:2243-2249. [PMID: 29240100 DOI: 10.1364/josaa.34.002243] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/23/2017] [Accepted: 11/01/2017] [Indexed: 06/07/2023]
4
Liu H, Kong W, Liu K, Zhao C, Du W, Wang C, Liu L, Gao P, Pu M, Luo X. Deep subwavelength interference lithography with tunable pattern period based on bulk plasmon polaritons. OPTICS EXPRESS 2017;25:20511-20521. [PMID: 29041731 DOI: 10.1364/oe.25.020511] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/04/2017] [Accepted: 07/18/2017] [Indexed: 06/07/2023]
5
Wang C, Zhang W, Zhao Z, Wang Y, Gao P, Luo Y, Luo X. Plasmonic Structures, Materials and Lenses for Optical Lithography beyond the Diffraction Limit: A Review. MICROMACHINES 2016;7:mi7070118. [PMID: 30404291 PMCID: PMC6189824 DOI: 10.3390/mi7070118] [Citation(s) in RCA: 22] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/29/2016] [Revised: 06/25/2016] [Accepted: 06/27/2016] [Indexed: 11/16/2022]
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