Measurement of surface plasmon autocorrelation functions

Imaging and controlling plasmonic interference fields at buried interfaces

Capturing and controlling plasmons at buried interfaces with nanometre and femtosecond resolution has yet to be achieved and is critical for next generation plasmonic devices. Here we use light to excite plasmonic interference patterns at a buried metal–dielectric interface in a nanostructured thin film. Plasmons are launched from a photoexcited array of nanocavities and their propagation is followed via photon-induced near-field electron microscopy (PINEM). The resulting movie directly captures the plasmon dynamics, allowing quantification of their group velocity at ∼0.3 times the speed of light, consistent with our theoretical predictions. Furthermore, we show that the light polarization and nanocavity design can be tailored to shape transient plasmonic gratings at the nanoscale. This work, demonstrating dynamical imaging with PINEM, paves the way for the femtosecond and nanometre visualization and control of plasmonic fields in advanced heterostructures based on novel two-dimensional materials such as graphene, MoS₂, and ultrathin metal films.

Visualizing surface plasmon polaritons at buried interfaces has remained elusive. Here, the authors develop a methodology to study the spatiotemporal evolution of buried near-fields within complex heterostructures, enabling the characterization of the next generation of plasmonic devices.

Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopy

We present theoretical estimates of the mean coefficients of spherical and chromatic aberration for low energy photoemission electron microscopy (PEEM). Using simple analytic models, we find that the aberration coefficients depend primarily on the difference between the photon energy and the photoemission threshold, as expected. However, the shape of the photoelectron spectral distribution impacts the coefficients by up to 30%. These estimates should allow more precise correction of aberration in PEEM in experimental situations where the aberration coefficients and precise electron energy distribution cannot be readily measured.

Focus issue on surface plasmon photonics introduction

The 6th International Conference on Surface Plasmon Photonics (SPP6) was held in Ottawa, Canada from May 26th to 31st, 2013. This independent series of biennial conferences is widely regarded as the premier series in the field, and the 6th edition maintained the tradition of excellence. This Focus Issue collects several papers related to research presented at SPP6, and although the number of papers it comprises is small compared to the total number of papers presented at the conference, the issue is representative and provides a good snapshot of the field at this point in time.