Hybrid diamond-silicon angular-dispersive x-ray monochromator with 0.25-meV energy bandwidth and high spectral efficiency

High-resolution monochromator using a high-efficiency single-mode x-ray resonator at Laue incidence

We report a high-resolution and high-efficiency monochromator with energy resolution, ΔE/E∼2.08*10^-7, utilizing a hard x-ray single-mode Fabry-Perot (FP) resonator at Laue incidence at 14.4388 keV. Instead of using multiple-crystal diffraction via several asymmetric-cut crystals, a 3 meV single-peak is generated from the interference of a Si-made two-plate cavity with a thickness of 70 μm and a gap of 45 μm, where a (0-40) Laue reflection is used to excite the backreflection (12 4 0) for the enhancement of the FP efficiency. Due to the large angular acceptance of (12 4 0) and (0-40), the energy tunability can be achieved by changing the incident angle into the resonator. The application of x-ray resonators at Laue incidence as a monochromator can be further implemented to x-ray optics.

Linear parabolic single-crystal diamond refractive lenses for synchrotron X-ray sources

Linear parabolic diamond refractive lenses are presented, designed to withstand high thermal and radiation loads coming from upgraded accelerator X-ray sources. Lenses were manufactured by picosecond laser treatment of a high-quality single-crystal synthetic diamond. Twelve lenses with radius of curvature at parabola apex R = 200 µm, geometrical aperture A = 900 µm and length L = 1.5 mm were stacked as a compound refractive lens and tested at the ESRF ID06 beamline. A focal spot of size 2.2 µm and a gain of 20 were measured at 8 keV. The lens profile and surface quality were estimated by grating interferometry and X-ray radiography. In addition, the influence of X-ray glitches on the focusing properties of the compound refractive lens were studied.

Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers

Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm(-1) spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm(-1) are required to close the gap in energy-momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 10(12) photons s(-1) in a 90 µeV bandwidth can be achieved on the sample. This will provide unique new possibilities for dynamics studies by IXS.

X-ray Echo Spectroscopy

X-ray echo spectroscopy, a counterpart of neutron spin echo, is being introduced here to overcome limitations in spectral resolution and weak signals of the traditional inelastic x-ray scattering (IXS) probes. An image of a pointlike x-ray source is defocused by a dispersing system comprised of asymmetrically cut specially arranged Bragg diffracting crystals. The defocused image is refocused into a point (echo) in a time-reversal dispersing system. If the defocused beam is inelastically scattered from a sample, the echo signal acquires a spatial distribution, which is a map of the inelastic scattering spectrum. The spectral resolution of the echo spectroscopy does not rely on the monochromaticity of the x rays, ensuring strong signals along with a very high spectral resolution. Particular schemes of x-ray echo spectrometers for 0.1-0.02 meV ultrahigh-resolution IXS applications (resolving power >10^{8}) with broadband ≃5-13  meV dispersing systems are introduced featuring more than 10^{3} signal enhancement. The technique is general, applicable in different photon frequency domains.

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

In this work, soft X-ray back-diffraction (XBD; X-ray diffraction at angles near and exactly equal to 90°) is explored. The experiment was conducted at the SXS beamline at Laboratorio Nacional de Luz Sincrotron, Brazil, at ∼3.2 keV. A high-resolution Si(220) multi-bounce back-diffraction monochromator was designed and constructed for this experiment. An ultra-thin Si(220) crystal (5 µm thick) was used as the sample. This ultra-thin crystal was characterized by profilometry, rocking-curve measurements and X-ray topography prior to the XBD measurements. It is shown that the measured forward-diffracted beam (o-beam) profiles, taken at different temperatures, are in close agreement with profiles predicted by the extended dynamical theory of X-ray diffraction, with the absence of multiple-beam diffraction (MBD). This is an important result for future studies on the basic properties of back-diffracted X-ray beams at energies slightly above the exact XBD condition (extreme condition where XBD is almost extinguished). Also, the results presented here indicate that stressed crystals behave like ideal strain-free crystals when used for low-energy XBD. This is mainly due to the large widths of XBD profiles, which lead to a low strain sensitivity in the detection of defects. This result opens up new possibilities for mounting spherical analyzers without degrading the energy resolution, at least for low energies. This is a path that may be used to construct a soft inelastic X-ray scattering spectrometer where different applications such as element-specific magnetic imaging tools could be explored.

An X-ray diffractometer using mirage diffraction

Some characteristics are reported of a triple-crystal diffractometer with a (+, −, +) setting of Si(220) using mirage diffraction. The advantages of this diffractometer are that its setup is easy, its structure is simple, the divergence angle from the second crystal is small and the energy resolution of the third crystal is very high.

Some characteristics are reported of a triple-crystal diffractometer with a (+, −, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractometer are that its setup is easy, its structure is simple, the divergence angle from the second crystal is small and the energy resolution of the third crystal is high, of the order of sub-meV.

High-contrast sub-millivolt inelastic X-ray scattering for nano- and mesoscale science

Photon and neutron inelastic scattering spectrometers are microscopes for imaging condensed matter dynamics on very small length and time scales. Inelastic X-ray scattering permitted the first quantitative studies of picosecond nanoscale dynamics in disordered systems almost 20 years ago. However, the nature of the liquid-glass transition still remains one of the great unsolved problems in condensed matter physics. It calls for studies at hitherto inaccessible time and length scales, and therefore for substantial improvements in the spectral and momentum resolution of the inelastic X-ray scattering spectrometers along with a major enhancement in spectral contrast. Here we report a conceptually new spectrometer featuring a spectral resolution function with steep, almost Gaussian tails, sub-meV (≃620 μeV) bandwidth and improved momentum resolution. The spectrometer opens up uncharted space on the dynamics landscape. New results are presented on the dynamics of liquid glycerol, in the regime that has become accessible with the novel spectrometer.