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Kim C, Scholz M, Madsen A. The influence of strain on image reconstruction in Bragg coherent X-ray diffraction imaging and ptychography. JOURNAL OF SYNCHROTRON RADIATION 2021; 28:1159-1165. [PMID: 34212879 PMCID: PMC8284403 DOI: 10.1107/s160057752100477x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/10/2020] [Accepted: 05/06/2021] [Indexed: 06/13/2023]
Abstract
A quantitative analysis of the effect of strain on phase retrieval in Bragg coherent X-ray diffraction imaging is reported. It is shown in reconstruction simulations that the phase maps of objects with strong step-like phase changes are more precisely retrieved than the corresponding modulus values. The simulations suggest that the reconstruction precision for both phase and modulus can be improved by employing a modulus homogenization (MH) constraint. This approach was tested on experimental data from a highly strained Fe-Al crystal which also features antiphase domain boundaries yielding characteristic π phase shifts of the (001) superlattice reflection. The impact of MH is significant and this study outlines a successful method towards imaging of strong phase objects using the next generation of coherent X-ray sources, including X-ray free-electron lasers.
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Affiliation(s)
- Chan Kim
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Markus Scholz
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Anders Madsen
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
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Ahn K, Cho IH, Kim J, Lee SY, Sung D, Jung C, Song C, Kang HC, Noh DY. Oxidation-induced three-dimensional morphological changes in Ni nanoparticles observed by coherent X-ray diffraction imaging. JOURNAL OF SYNCHROTRON RADIATION 2021; 28:505-511. [PMID: 33650563 DOI: 10.1107/s1600577520015945] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/21/2020] [Accepted: 12/06/2020] [Indexed: 06/12/2023]
Abstract
Three-dimensional structures of Ni nanoparticles undergoing significant morphological changes on oxidation were observed non-destructively using coherent X-ray diffraction imaging. The Ni particles were oxidized into Ni1O1 while forming pores of various sizes internally. For each Ni nanoparticle, one large void was identified at a lower corner near the interface with the substrate. The porosity of the internal region of the agglomerated Ni oxide was about 38.4%. Regions of high NiO density were mostly observed at the outer crust of the oxide or at the boundary with the large voids. This research expands our understanding of general catalytic reactions with direct observation of oxidation-induced nanoscale morphological changes.
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Affiliation(s)
- Kangwoo Ahn
- Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - In Hwa Cho
- Center for Advanced X-ray Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Junhyung Kim
- Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Su Yong Lee
- Center for Advanced X-ray Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Daeho Sung
- Center for Advanced X-ray Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Chulho Jung
- Center for Advanced X-ray Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Changyong Song
- Center for Advanced X-ray Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
| | - Hyon Chol Kang
- Department of Materials Science and Engineering, Chosun University, Gwangju 61452, Korea
| | - Do Young Noh
- Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
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Hill J, Campbell S, Carini G, Chen-Wiegart YCK, Chu Y, Fluerasu A, Fukuto M, Idir M, Jakoncic J, Jarrige I, Siddons P, Tanabe T, Yager KG. Future trends in synchrotron science at NSLS-II. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2020; 32:374008. [PMID: 32568740 DOI: 10.1088/1361-648x/ab7b19] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/09/2020] [Accepted: 02/28/2020] [Indexed: 06/11/2023]
Abstract
In this paper, we summarize briefly some of the future trends in synchrotron science as seen at the National Synchrotron Light Source II, a new, low emittance source recently commissioned at Brookhaven National Laboratory. We touch upon imaging techniques, the study of dynamics, the increasing use of multimodal approaches, the vital importance of data science, and other enabling technologies. Each are presently undergoing a time of rapid change, driving the field of synchrotron science forward at an ever increasing pace. It is truly an exciting time and one in which Roger Cowley, to whom this journal issue is dedicated, would surely be both invigorated by, and at the heart of.
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Affiliation(s)
- John Hill
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Stuart Campbell
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Gabriella Carini
- Instrumentation Division (IO), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Yu-Chen Karen Chen-Wiegart
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
- Materials Science & Chemical Engineering, Stony Brook University, Stony Brook, NY, United States of America
| | - Yong Chu
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Andrei Fluerasu
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Masafumi Fukuto
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Mourad Idir
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Jean Jakoncic
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Ignace Jarrige
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Peter Siddons
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Toshi Tanabe
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Kevin G Yager
- Center for Functional Nanomaterials (CFN), Brookhaven National Laboratory, Upton, NY, United States of America
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Noh DY, Kim C, Kim Y, Song C. Enhancing resolution in coherent x-ray diffraction imaging. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2016; 28:493001. [PMID: 27754981 DOI: 10.1088/0953-8984/28/49/493001] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Achieving a resolution near 1 nm is a critical issue in coherent x-ray diffraction imaging (CDI) for applications in materials and biology. Albeit with various advantages of CDI based on synchrotrons and newly developed x-ray free electron lasers, its applications would be limited without improving resolution well below 10 nm. Here, we review the issues and efforts in improving CDI resolution including various methods for resolution determination. Enhancing diffraction signal at large diffraction angles, with the aid of interference between neighboring strong scatterers or templates, is reviewed and discussed in terms of increasing signal-to-noise ratio. In addition, we discuss errors in image reconstruction algorithms-caused by the discreteness of the Fourier transformations involved-which degrade the spatial resolution, and suggest ways to correct them. We expect this review to be useful for applications of CDI in imaging weakly scattering soft matters using coherent x-ray sources including x-ray free electron lasers.
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Affiliation(s)
- Do Young Noh
- Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea
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Kim C, Kim Y, Song C, Kim SS, Kim S, Kang HC, Hwu Y, Tsuei KD, Liang KS, Noh DY. Resolution enhancement in coherent x-ray diffraction imaging by overcoming instrumental noise. OPTICS EXPRESS 2014; 22:29161-9. [PMID: 25402155 DOI: 10.1364/oe.22.029161] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
We report that reference objects, strong scatterers neighboring weak phase objects, enhance the phase retrieval and spatial resolution in coherent x-ray diffraction imaging (CDI). A CDI experiment with Au nano-particles exhibited that the reference objects amplified the signal-to-noise ratio in the diffraction intensity at large diffraction angles, which significantly enhanced the image resolution. The interference between the diffracted x-ray from reference objects and a specimen also improved the retrieval of the phase of the diffraction signal. The enhancement was applied to image NiO nano-particles and a mitochondrion and confirmed in a simulation with a bacteria phantom. We expect that the proposed method will be of great help in imaging weakly scattering soft matters using coherent x-ray sources including x-ray free electron lasers.
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Jones MWM, Elgass K, Junker MD, Luu MB, Ryan MT, Peele AG, van Riessen GA. Mapping biological composition through quantitative phase and absorption X-ray ptychography. Sci Rep 2014; 4:6796. [PMID: 25348877 PMCID: PMC4210942 DOI: 10.1038/srep06796] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/23/2014] [Accepted: 10/07/2014] [Indexed: 11/09/2022] Open
Abstract
Isolating compositional information in biological X-ray imaging can be problematic as such information is conflated with thickness and density variations when viewing in projection through a sample. We demonstrate an effective method for identifying variations in material composition by simultaneously using the quantitative phase and magnitude images provided through soft X-ray ptychography. Using this approach we show significantly increased contrast and improved reliability of the identification of intracellular features from uncharacterised samples. While demonstrated for X-ray ptychography, this method is immediately applicable to electron and optical microscopy methods where the complex transmission function of the sample is recovered.
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Affiliation(s)
- Michael W M Jones
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Physics, La Trobe University, Bundoora 3086, Australia
| | - Kirstin Elgass
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Biochemistry, La Trobe University, Bundoora 3086, Australia
| | - Mark D Junker
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Physics, La Trobe University, Bundoora 3086, Australia
| | - Mac B Luu
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Physics, La Trobe University, Bundoora 3086, Australia
| | - Michael T Ryan
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Biochemistry, La Trobe University, Bundoora 3086, Australia
| | - Andrew G Peele
- 1] ARC Centre of Excellence for Coherent X-Ray Science, Department of Physics, La Trobe University, Bundoora 3086, Australia [2] Australian Synchrotron, 800 Blackburn Rd, Clayton 3168, Australia [3] ARC Centre of Excellence for Advanced Molecular Imaging, Australian Synchrotron, 800 Blackburn Rd, Clayton 3168, Australia
| | - Grant A van Riessen
- ARC Centre of Excellence for Coherent X-Ray Science, Department of Physics, La Trobe University, Bundoora 3086, Australia
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