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Paria D, Vadakkumbatt V, Ravindra P, Avasthi S, Ghosh A. Unconventional plasmonic sensitization of graphene in mid-infrared. NANOTECHNOLOGY 2021; 32:315202. [PMID: 33873164 DOI: 10.1088/1361-6528/abf96c] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/24/2020] [Accepted: 04/19/2021] [Indexed: 06/12/2023]
Abstract
Light-matter interaction in graphene can be engineered and substantially enhanced through plasmonic sensitization, which has led to numerous applications in photodetection, sensing, photocatalysis and spectroscopy. The majority of these designs have relied on conventional plasmonic materials such as gold, silver and aluminum. This limits the implementation of such devices to the ultraviolet and visible regimes of the electromagnetic spectrum. However, for many practical applications, including those relevant to security and defense, the development of new strategies and materials for sensing and detection of infra red (IR) light is crucial. Here we use surface enhanced Raman spectroscopy (SERS), for direct visualization and estimation of enhanced light-matter interaction in graphene in the mid-IR regime, through sensitization by an unconventional plasmonic material. Specifically, we fabricate a hybrid device consisting of a single layer graphene and a two-dimensional array of nanodiscs of aluminum doped zinc oxide (AZO), which is a highly doped semiconductor, exhibiting plasmonic resonance in the mid-IR. We find that the enhancement in the SERS signal of graphene is of similar magnitude to what has been achieved previously in the visible using conventional plasmonic materials. Our results establish the potential of such hybrid systems for graphene-based optical and optoelectronic applications in the mid-IR.
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Affiliation(s)
- Debadrita Paria
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore 560012, India
| | | | - Pramod Ravindra
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore 560012, India
| | - Sushobhan Avasthi
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore 560012, India
| | - Ambarish Ghosh
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore 560012, India
- Department of Physics, Indian Institute of Science, Bangalore 560012, India
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Nateq MH, Ceccato R. Enhanced Sol-Gel Route to Obtain a Highly Transparent and Conductive Aluminum-Doped Zinc Oxide Thin Film. MATERIALS 2019; 12:ma12111744. [PMID: 31146384 PMCID: PMC6600773 DOI: 10.3390/ma12111744] [Citation(s) in RCA: 18] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/30/2019] [Revised: 05/23/2019] [Accepted: 05/23/2019] [Indexed: 01/13/2023]
Abstract
The electrical and optical properties of sol–gel derived aluminum-doped zinc oxide thin films containing 2 at.% Al were investigated considering the modifying effects of (1) increasing the sol H2O content and (2) a thermal treatment procedure with a high-temperature approach followed by an additional heat-treatment step under a reducing atmosphere. According to the results obtained via the TG-DTA analysis, FT-IR spectroscopy, X-ray diffraction technique, and four-point probe resistivity measurements, it is argued that in the modified sample, the sol hydrolysis, decomposition of the deposited gel, and crystallization of grains result in grains of larger crystallite size in the range of 20 to 30 nm and a stronger c-axis preferred orientation with slightly less microstrain. The obtained morphology and grain-boundary characteristics result in improved conductivity considering the resistivity value below 6 mΩ·cm. A detailed investigation of the samples’ optical properties, in terms of analyzing their absorption and dispersion behaviors through UV-Vis-NIR spectroscopy, support our reasoning for the increase of the mobility, and to a lesser extent the concentration of charge carriers, while causing only a slight degradation of optical transmittance down to nearly 80%. Hence, an enhanced performance as a transparent conducting film is claimed for the modified sample by comparing the figure-of-merit values.
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Affiliation(s)
- Mohammad Hossein Nateq
- Department of Industrial Engineering, University of Trento, Via Sommarive 9, 38123 Trento, Italy.
| | - Riccardo Ceccato
- Department of Industrial Engineering, University of Trento, Via Sommarive 9, 38123 Trento, Italy.
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Li L, Liu X, Zhang H, Zhang B, Jie W, Sellin PJ, Hu C, Zeng G, Xu Y. Enhanced X-ray Sensitivity of MAPbBr 3 Detector by Tailoring the Interface-States Density. ACS APPLIED MATERIALS & INTERFACES 2019; 11:7522-7528. [PMID: 30693756 DOI: 10.1021/acsami.8b18598] [Citation(s) in RCA: 33] [Impact Index Per Article: 6.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
An important factor for the high performance of light-harvesting devices is the presence of surface trappings. Therefore, understanding and controlling the carrier recombination of the organic-inorganic hybrid perovskite surface is critical for the device design and optimization. Here, we report the use of aluminum zinc oxide (AZO) as the anode to construct a p-n junction structure MAPbBr3 nuclear radiation detector. The AZO/MAPbBr3/Au detector can tolerate an electrical field of 500 V·cm-1 and exhibit a very low leakage current of ∼9 nA, which is 1 order of magnitude lower than that of the standard ohmic contact device. The interface state density of AZO/MAPbBr3 contact was reduced from 2.17 × 1010 to 8.7 × 108 cm-2 by annealing at 100 °C under an Ar atmosphere. Consequently, a photocurrent to dark current ratio of 190 was realized when exposed to a green light-emitting diode with a wavelength of 520 nm (∼200 mW·cm-2). Simultaneously, a high X-ray sensitivity of ∼529 μC·Gyair-1 cm-2 was achieved under 80 kVp X-ray at an electric field of 50 V·cm-1. These results demonstrate the use of surface engineering to further optimize the performance of MAPbBr3 detectors, which have many potential applications in medical and security detection with low radiation dose brought to the human body.
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Affiliation(s)
| | | | | | | | | | - Paul J Sellin
- Department of Physics , University of Surrey , Guildford GU2 7XH , U.K
| | - Chuanhao Hu
- Nuclear Technology Key Laboratory of Earth Science , Chengdu University of Technology , Chengdu 610051 , China
| | - Guoqiang Zeng
- Nuclear Technology Key Laboratory of Earth Science , Chengdu University of Technology , Chengdu 610051 , China
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Zheng H, Zhang RJ, Li DH, Chen X, Wang SY, Zheng YX, Li MJ, Hu ZG, Dai N, Chen LY. Optical Properties of Al-Doped ZnO Films in the Infrared Region and Their Absorption Applications. NANOSCALE RESEARCH LETTERS 2018; 13:149. [PMID: 29752609 PMCID: PMC5948193 DOI: 10.1186/s11671-018-2563-9] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/05/2018] [Accepted: 04/30/2018] [Indexed: 06/08/2023]
Abstract
The optical properties of aluminum-doped zinc oxide (AZO) thin films were calculated rapidly and accurately by point-by-point analysis from spectroscopic ellipsometry (SE) data. It was demonstrated that there were two different physical mechanisms, i.e., the interfacial effect and crystallinity, for the thickness-dependent permittivity in the visible and infrared regions. In addition, there was a blue shift for the effective plasma frequency of AZO when the thickness increased, and the effective plasma frequency did not exist for AZO ultrathin films (< 25 nm) in the infrared region, which demonstrated that AZO ultrathin films could not be used as a negative index metamaterial. Based on detailed permittivity research, we designed a near-perfect absorber at 2-5 μm by etching AZO-ZnO alternative layers. The alternative layers matched the phase of reflected light, and the void cylinder arrays extended the high absorption range. Moreover, the AZO absorber demonstrated feasibility and applicability on different substrates.
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Affiliation(s)
- Hua Zheng
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083 China
| | - Rong-Jun Zhang
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
| | - Da-Hai Li
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
| | - Xin Chen
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083 China
| | - Song-You Wang
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
| | - Yu-Xiang Zheng
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
| | - Meng-Jiao Li
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai, 200241 China
| | - Zhi-Gao Hu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronic Engineering, East China Normal University, Shanghai, 200241 China
| | - Ning Dai
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083 China
| | - Liang-Yao Chen
- Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433 China
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Li HK, Chen TP, Hu SG, Li XD, Liu Y, Lee PS, Wang XP, Li HY, Lo GQ. Highly spectrum-selective ultraviolet photodetector based on p-NiO/n-IGZO thin film heterojunction structure. OPTICS EXPRESS 2015; 23:27683-27689. [PMID: 26480430 DOI: 10.1364/oe.23.027683] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Ultraviolet photodetector with p-n heterojunction is fabricated by magnetron sputtering deposition of n-type indium gallium zinc oxide (n-IGZO) and p-type nickel oxide (p-NiO) thin films on ITO glass. The performance of the photodetector is largely affected by the conductivity of the p-NiO thin film, which can be controlled by varying the oxygen partial pressure during the deposition of the p-NiO thin film. A highly spectrum-selective ultraviolet photodetector has been achieved with the p-NiO layer with a high conductivity. The results can be explained in terms of the "optically-filtering" function of the NiO layer.
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