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For: Su WH, Chen SY. One-shot profile inspection for surfaces with depth, color and reflectivity discontinuities. Opt Express 2017;25:9999-10015. [PMID: 28468378 DOI: 10.1364/oe.25.009999] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Number Cited by Other Article(s)
1
Phase-Shifting Projected Fringe Profilometry Using Binary-Encoded Patterns. PHOTONICS 2021. [DOI: 10.3390/photonics8090362] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
2
Ha M, Pham D, Xiao C. Accurate feature point detection method exploiting the line structure of the projection pattern for 3D reconstruction. APPLIED OPTICS 2021;60:2926-2937. [PMID: 33983185 DOI: 10.1364/ao.414952] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/12/2020] [Accepted: 03/09/2021] [Indexed: 06/12/2023]
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