Beam alignment based on two-dimensional power spectral density of a near-field image

Real-time synchronized monitoring for the overlap accuracy of the combining beam spot in a wavelength beam combination based on confocal planes

Beam overlap accuracy in a wavelength beam combination system determines the beam quality and efficiency, so systematic monitoring of overlap accuracy is essential. In this work, a method of performing real-time synchronized monitoring and recording overlap accuracy for a combining beam spot is proposed. Firstly, theoretical calculations for monitoring different wavelength sub-beam positions and angular errors are established. Then, an optical design and grayscale centroid algorithm are developed to analyze and simulate the combination spots. A monitoring device was designed and constructed to meet the requirements of combining system applications, which achieved an accuracy of 8.86 µrad. Finally, the method successfully monitored the system spot fluctuation range within ±22 µrad. This study resolves the issue of distinguishing the different wavelength sub-beams and their response delays in traditional combining beams. It offers precise error data for real-time synchronized calibration of the overlap accuracy in laser beam combining technology.

Precision optical path alignment system for point diffraction interferometer based on image information

In a point diffraction interferometer, the existence of alignment error between an objective convergent spot and a diffraction pinhole can lead to wavefront error and diffraction intensity reduction. Meanwhile, the contrast of the point diffraction interferograms probably decreases in this procedure. These changes will have significant influence on its inspection precision. A precise alignment system of an optical path for a point diffraction interferometer is proposed in this paper. First, diffraction theory is used to analyze the mathematical relationships of alignment error to diffraction wavefront error and numerical aperture and wavefront error to pinhole size. Then, according to the requirement, the scheme of an optical path alignment system is designed. In this stage, alignment images as well as intensities of a reflected and diffracted beam from the point diffraction plate will be acquired. In addition, an image processing algorithm for measuring alignment error is designed, and a mathematical model between quantities of measurement and control is constructed. Finally, implementation and experiment of this method are also introduced. Misalignment situations, including lateral translation, longitudinal defocus, and tilt error, are well eliminated, and the quality of interferograms is also improved. From the results, it can be concluded that the system is of desirable precision and efficiency.