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For: Chen H, Yin Y, Cai Z, Xu W, Liu X, Meng X, Peng X. Suppression of the nonlinear phase error in phase shifting profilometry: considering non-smooth reflectivity and fractional period. Opt Express 2018;26:13489-13505. [PMID: 29801374 DOI: 10.1364/oe.26.013489] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/28/2018] [Accepted: 05/07/2018] [Indexed: 06/08/2023]
Number Cited by Other Article(s)
1
Du J, Yang F, Guo H, Zhu J, Zhou P. Parameter selection on a multi-exposure fusion method for measuring surfaces with varying reflectivity in microscope fringe projection profilometry. APPLIED OPTICS 2024;63:3506-3517. [PMID: 38856536 DOI: 10.1364/ao.517940] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/08/2024] [Accepted: 04/07/2024] [Indexed: 06/11/2024]
2
Yao P, Chen Y, Gai S, Da F. Accurate 3D Measurement of Complex Texture Objects by Height Compensation Using a Dual-Projector Structure. IEEE TRANSACTIONS ON IMAGE PROCESSING : A PUBLICATION OF THE IEEE SIGNAL PROCESSING SOCIETY 2024;33:3021-3030. [PMID: 38648148 DOI: 10.1109/tip.2024.3389609] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/25/2024]
3
Wan Y, Cao Y, Xu M, Tang T. Enhanced Fourier-Hilbert-transform suppression for saturation-induced phase error in phase-shifting profilometry. OPTICS EXPRESS 2023;31:37683-37702. [PMID: 38017894 DOI: 10.1364/oe.502288] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/07/2023] [Accepted: 10/12/2023] [Indexed: 11/30/2023]
4
Xu H, Yang L, Zhu H, Rao Y, Liu L, Wang Y. Nonlinear error reduction for phase-shifting profilometry considering periodicity and symmetry of a phase histogram. APPLIED OPTICS 2023;62:6437-6446. [PMID: 37706837 DOI: 10.1364/ao.499592] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/03/2023] [Accepted: 07/30/2023] [Indexed: 09/15/2023]
5
Li H, Wei H, Liu J, Deng G, Zhou S, Wang W, He L, Tian P. Fringe Projection Profilometry Based on Saturated Fringe Restoration in High Dynamic Range Scenes. SENSORS (BASEL, SWITZERLAND) 2023;23:3133. [PMID: 36991843 PMCID: PMC10058288 DOI: 10.3390/s23063133] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/30/2023] [Revised: 03/10/2023] [Accepted: 03/13/2023] [Indexed: 06/19/2023]
6
Tan J, Su W, He Z, Bai Y, Dong B, Xie S. Generic saturation-induced phase error correction for structured light 3D shape measurement. OPTICS LETTERS 2022;47:3387-3390. [PMID: 35838687 DOI: 10.1364/ol.461663] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/25/2022] [Accepted: 06/16/2022] [Indexed: 06/15/2023]
7
Intensity-Averaged Double Three-Step Phase-Shifting Algorithm with Color-Encoded Fringe Projection. PHOTONICS 2022. [DOI: 10.3390/photonics9030173] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]
8
Hu J, Zhang S, Hu Y, Hao Q. Defocused binary fringe phase error modeling and compensation using depth-discrete Fourier series fitting. APPLIED OPTICS 2021;60:10047-10054. [PMID: 34807108 DOI: 10.1364/ao.440408] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/16/2021] [Accepted: 10/08/2021] [Indexed: 06/13/2023]
9
Liu X, Tao T, Wan Y, Kofman J. Real-time motion-induced-error compensation in 3D surface-shape measurement. OPTICS EXPRESS 2019;27:25265-25279. [PMID: 31510401 DOI: 10.1364/oe.27.025265] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/30/2019] [Accepted: 08/01/2019] [Indexed: 06/10/2023]
10
Gai S, Da F, Liu C. Multiple-gamma-value based phase error compensation method for phase measuring profilometry. APPLIED OPTICS 2018;57:10290-10299. [PMID: 30645237 DOI: 10.1364/ao.57.010290] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/31/2018] [Accepted: 11/07/2018] [Indexed: 06/09/2023]
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