• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4624704)   Today's Articles (3559)   Subscriber (49415)
For: Wang Y, Zhang J, Luo B. High dynamic range 3D measurement based on spectral modulation and hyperspectral imaging. Opt Express 2018;26:34442-34450. [PMID: 30650867 DOI: 10.1364/oe.26.034442] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/25/2018] [Accepted: 10/26/2018] [Indexed: 06/09/2023]
Number Cited by Other Article(s)
1
Du J, Yang F, Guo H, Zhu J, Zhou P. Parameter selection on a multi-exposure fusion method for measuring surfaces with varying reflectivity in microscope fringe projection profilometry. APPLIED OPTICS 2024;63:3506-3517. [PMID: 38856536 DOI: 10.1364/ao.517940] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/08/2024] [Accepted: 04/07/2024] [Indexed: 06/11/2024]
2
Niu X, Li F, Zuo C, Zhang Q, Wang Y. Low-power laser image enhancement via deep feature recovery for HDR 3D measurement. OPTICS EXPRESS 2024;32:5748-5759. [PMID: 38439293 DOI: 10.1364/oe.509805] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/20/2023] [Accepted: 12/25/2023] [Indexed: 03/06/2024]
3
Li F, Niu X, Zhang J, Zhang Q, Wang Y. Physics-based supervised learning method for high dynamic range 3D measurement with high fidelity. OPTICS LETTERS 2024;49:602-605. [PMID: 38300069 DOI: 10.1364/ol.506775] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/27/2023] [Accepted: 12/26/2023] [Indexed: 02/02/2024]
4
Wan Y, Cao Y, Xu M, Tang T. Enhanced Fourier-Hilbert-transform suppression for saturation-induced phase error in phase-shifting profilometry. OPTICS EXPRESS 2023;31:37683-37702. [PMID: 38017894 DOI: 10.1364/oe.502288] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/07/2023] [Accepted: 10/12/2023] [Indexed: 11/30/2023]
5
Wan Y, Cao Y, Xu M, Tang T. Saturation-Induced Phase Error Compensation Method Using Complementary Phase. MICROMACHINES 2023;14:1258. [PMID: 37374843 DOI: 10.3390/mi14061258] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/27/2023] [Revised: 06/13/2023] [Accepted: 06/14/2023] [Indexed: 06/29/2023]
6
Tan J, Su W, He Z, Bai Y, Dong B, Xie S. Generic saturation-induced phase error correction for structured light 3D shape measurement. OPTICS LETTERS 2022;47:3387-3390. [PMID: 35838687 DOI: 10.1364/ol.461663] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/25/2022] [Accepted: 06/16/2022] [Indexed: 06/15/2023]
7
Yu C, Ji F, Xue J, Wang Y. Adaptive Binocular Fringe Dynamic Projection Method for High Dynamic Range Measurement. SENSORS 2019;19:s19184023. [PMID: 31540417 PMCID: PMC6767352 DOI: 10.3390/s19184023] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/15/2019] [Revised: 09/08/2019] [Accepted: 09/14/2019] [Indexed: 11/16/2022]
8
Wu G, Wu Y, Li L, Liu F. High-resolution few-pattern method for 3D optical measurement. OPTICS LETTERS 2019;44:3602-3605. [PMID: 31305582 DOI: 10.1364/ol.44.003602] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/05/2019] [Accepted: 06/22/2019] [Indexed: 06/10/2023]
9
Multiple Laser Stripe Scanning Profilometry Based on Microelectromechanical Systems Scanning Mirror Projection. MICROMACHINES 2019;10:mi10010057. [PMID: 30654503 PMCID: PMC6356723 DOI: 10.3390/mi10010057] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/10/2018] [Revised: 01/01/2019] [Accepted: 01/10/2019] [Indexed: 11/17/2022]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA