Unidirectional scattering exploited transverse displacement sensor with tunable measuring range

Magnetic transverse unidirectional scattering and longitudinal displacement sensing in silicon nanodimer

Unidirectional scattering, crucial for manipulating light at the nanoscale, has wide-ranging applications from optical manipulation to sensing. While traditionally achieved through interactions between electric multipoles or between electric and magnetic multipoles, reports on unidirectional scattering driven purely by magnetic multipoles are limited. In this study, we undertake a theoretical exploration of transverse unidirectional scattering induced by magnetic multipoles, employing tightly focused azimuthally polarized beams (APBs) in interaction with a silicon nanodimer comprising two non-concentric nanorings. Through numerical simulations and theoretical analysis, we validate the transverse unidirectional scattering, predominantly governed by magnetic dipolar and quadrupolar resonances. Moreover, the directionality of this unidirectional scattering shows a strong correlation with the longitudinal displacement of the nanodimer within a specific range, showcasing its potential for longitudinal displacement sensing. Our study advances optical scattering control in nanostructures and guides the design of on-chip longitudinal displacement sensors.

Broadband transverse unidirectional scattering and large range nanoscale displacement measuring based on the interaction between a tightly focused azimuthally polarized beam and a silicon hollow nanostructure

We theoretically propose a broadband transverse unidirectional scattering scheme based on the interaction between a tightly focused azimuthally polarized beam (APB) and a silicon hollow nanostructure. When the nanostructure is located at a specific position in the focal plane of the APB, the transverse scattering fields can be decomposed into contributions from transverse components of the electric dipoles, longitudinal components of magnetic dipoles and magnetic quadrupole components. In order to satisfy the transverse Kerker conditions for these multipoles within a wide infrared spectrum, we design a novel nanostructure with hollow parallelepiped shape. Through numerical simulations and theoretical calculations, this scheme exhibits efficient transverse unidirectional scattering effects in the wavelength range of 1440 nm to 1820 nm (380 nm). In addition, by adjusting the position of the nanostructure on the x-axis, efficient nanoscale displacement sensing with large measuring ranges can be achieved. After analyses, the results prove that our research may have potential applications in the field of high-precision on-chip displacement sensors.

High-FOM Temperature Sensing Based on Hg-EIT-Like Liquid Metamaterial Unit

High-performance temperature sensing is a key technique in modern Internet of Things. However, it is hard to attain a high precision while achieving a compact size for wireless sensing. Recently, metamaterials have been proposed to design a microwave, wireless temperature sensor, but precision is still an unsolved problem. By combining the high-quality factor (Q-factor) feature of a EIT-like metamaterial unit and the large temperature-sensing sensitivity performance of liquid metals, this paper designs and experimentally investigates an Hg-EIT-like metamaterial unit block for high figure-of-merit (FOM) temperature-sensing applications. A measured FOM of about 0.68 is realized, which is larger than most of the reported metamaterial-inspired temperature sensors.

Broadband unidirectional transverse light scattering in a V-shaped silicon nanoantenna

The efficient manipulation of light-matter interactions in subwavelength all-dielectric nanostructures offers a unique opportunity for the design of novel low-loss visible- and telecom-range nanoantennas for light routing applications. Several studies have achieved longitudinal and transverse light scattering with a proper amplitude and phase balance among the multipole moments excited in dielectric nanoantennas. However, they only involve the interaction between electric dipole, magnetic dipole, and up to the electric quadrupole. Here, we extend and demonstrate a unidirectional transverse light scattering in a V-shaped silicon nanoantenna that involves the balance up to the magnetic quadrupole moment. Based on the long-wavelength approximation and exact multipole decomposition analysis, we find the interference conditions needed for near-unity unidirectional transverse light scattering along with near-zero scattering in the opposite direction. These interference conditions involve relative amplitude and phases of the electromagnetic dipoles and quadrupoles supported by the silicon nanoantenna. The conditions can be applied for the development of either polarization- or wavelength- dependent light routing on a V-shaped silicon and plasmonic nanoantennas.

Robust and accurate measurement of optical freeform surfaces with wavefront deformation correction

The non-null test to detect the modulated wavefront is a widely used method in optical freeform surface measurement. In this study, the wavefront deformation in the non-null test of an optical freeform surface measurement was corrected based on the wavefront propagation model to improve measurement accuracy. A freeform surface wavefront correction (FSWC) measurement system was established to validate the proposed method. Simulation and experimental studies indicated that the proposed method can reduce the influence of freeform surface wavefront deformation in space propagation. Moreover, the freeform surface form accuracy measured by FSWC can reach a root-mean-squared value of 10 nm.

Ultra-sensitive measurement of transverse displacements with linear photonic gears

Accurately measuring mechanical displacements is essential for a vast portion of current technologies. Several optical techniques accomplish this task, allowing for non-contact sensing even below the diffraction limit. Here we introduce an optical encoding technique, dubbed “linear photonic gears”, that enables ultra-sensitive measurements of a transverse displacement by mapping it into the polarization rotation of a laser beam. In ordinary ambient conditions, we measure the relative shift between two objects with a resolution of 400 pm. We argue that a resolution of 50 pm should be achievable with existing state-of-the-art technologies. Our single-optical-path scheme is intrinsically stable and it could be implemented as a compact sensor, using cost effective integrated optics. We anticipate it may have a strong impact on both research and industry.

The authors introduce linear gears to measure mechanical displacements with high sensitivity. Such gears covert tiny transverse shifts between two birefringent devices into a giant polarization rotation of a laser beam.

Lateral shifts of linearly- and radially-polarized Bessel beams scattered by a nanosphere

We report the investigation on the lateral shifts that linearly-polarized (LP) and radially-polarized (RP) Bessel beams experience during the Mie scattering by a nanosphere. A numerical procedure based on the angular spectrum theory is developed to solve the scattered electromagnetic field and subsequent lateral shifts with a high computational efficiency, which can be easily applied to an arbitrary shaped polarized beam. The influences of different factors, including conical angle, nanosphere radius and position, on the lateral shifts are systematically investigated. The results demonstrate that for on-axis scattering, a LP Bessel beam can be regarded as a plane wave with the same polarization state but an equivalent longer wavelength, while a RP Bessel beam can be regarded as a plane wave with a polarization state along the propagation direction exhibiting independence on the conical angle. The findings help deepen our understandings of lateral shifts in light scattering of vectorial non-diffractive beams.

Nanometric displacement sensor with a switchable measuring range using a cylindrical vector beam excited silicon nanoantenna

We demonstrate a nanometric displacement sensor with a switchable measuring range by using a single silicon nanoantenna. It is revealed that the interference between the longitudinal and transverse dipolar scattering can be well tuned by moving the nanoantenna in the focal field of the cylindrical vector beam. As a result, a position related scattering directivity is found and is used as a displacement sensor with a 4.5 nm lateral resolution. Interestingly, the measuring range of this displacement sensor can be extended by twice through simply changing the excitation from the azimuthally polarized beam to the radially polarized beam. Our results provide a facile way to tune the measuring range of the nanometric displacement sensor and may open up an avenue to super-resolution microscopy and optical nanometrology.

Super-Resolution without Imaging: Library-Based Approaches Using Near-to-Far-Field Transduction by a Nanophotonic Structure

Super-resolution imaging is often viewed in terms of engineering narrow point spread functions, but nanoscale optical metrology can be performed without real-space imaging altogether. In this paper, we investigate how partial knowledge of scattering nanostructures enables extraction of nanoscale spatial information from far-field radiation patterns. We use principal component analysis to find patterns in calibration data and use these patterns to retrieve the position of a point source of light. In an experimental realization using angle-resolved cathodoluminescence, we retrieve the light source position with an average error below λ/100. The patterns found by principal component analysis reflect the underlying scattering physics and reveal the role the scattering nanostructure plays in localization success. The technique described here is highly general and can be applied to gain insight into and perform subdiffractive parameter retrieval in various applications.

Tightly focused light field with controllable pure transverse polarization state at the focus

We report on a facile and flexible scheme for producing the controllable pure transverse polarization state at the focus within a tightly focused field. Toward this aim, a special type of hybrid vector beam exhibiting unusual "8-type" mapping tracks of azimuthal polarization states on the Poincaré sphere is employed. Due to the peculiar polarization structures, at the focus, there is only the transverse component, while the longitudinal component is zero for any 8-type vector beam. More strikingly, the transverse polarization state at the focus is exactly the same as that of the cross point of the 8-type mapping track. Benefiting from this appealing polarization relationship, an arbitrary transverse polarization state can be easily achieved at the focus via altering the mapping track of incident vector beams. These results may have potential applications in nano and spin photonics.

Towards fully integrated photonic displacement sensors

The field of optical metrology with its high precision position, rotation and wavefront sensors represents the basis for lithography and high resolution microscopy. However, the on-chip integration—a task highly relevant for future nanotechnological devices—necessitates the reduction of the spatial footprint of sensing schemes by the deployment of novel concepts. A promising route towards this goal is predicated on the controllable directional emission of the fundamentally smallest emitters of light, i.e., dipoles, as an indicator. Here we realize an integrated displacement sensor based on the directional emission of Huygens dipoles excited in an individual dipolar antenna. The position of the antenna relative to the excitation field determines its directional coupling into a six-way crossing of photonic crystal waveguides. In our experimental study supported by theoretical calculations, we demonstrate the first prototype of an integrated displacement sensor with a standard deviation of the position accuracy below λ/300 at room temperature and ambient conditions.

Integrated devices are useful for applications like sample stabilization, microscopy, adaptive optics, and acceleration sensors. Here the authors demonstrate a fully integrated chip-scale light-based displacement sensor using Huygens dipole scattering of light.

Characterizing localized surface plasmon resonances using focused radially polarized beam

We demonstrate a scheme to characterize the localized surface plasmon resonances (LSPRs) of an individual metallic nanorod by employing a focused radially polarized beam (RPB) illumination under normal incidence. The focused RPB has a unique three-dimensional electric field polarization distribution in the focal plane, which can effectively and selectively excite the dipole and multipole plasmon resonances in a metallic nanorod by just moving the nanorod within the focal plane. This performance can be attributed to the mode matching between the excitation electric field of the incident RPB and the LSPRs in a metallic nanorod. Emphatically, in contrast to the commonly used oblique incidence illumination with the linearly polarized light, our proposed scheme is based on the normally incident light illumination and compatible with conventional optical microscopy, which is more scalable for spectroscopic characterization of individual nanostructures.