• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4609574)   Today's Articles (122)   Subscriber (49378)
For: Graves LR, Quach H, Choi H, Kim DW. Infinite deflectometry enabling 2π-steradian measurement range. Opt Express 2019;27:7602-7615. [PMID: 30876322 DOI: 10.1364/oe.27.007602] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/21/2019] [Accepted: 02/17/2019] [Indexed: 06/09/2023]
Number Cited by Other Article(s)
1
Gonzalez-Utrera D, Villalobos-Mendoza B, Diaz-Uribe R, Aguirre-Aguirre D. Modeling, fabrication, and metrology of 3D printed Alvarez lenses prototypes. OPTICS EXPRESS 2024;32:3512-3527. [PMID: 38297571 DOI: 10.1364/oe.513553] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/16/2023] [Accepted: 01/09/2024] [Indexed: 02/02/2024]
2
Jiang S, He Q, Xing Y, Liu L, Yang J. Multi-view stitching phase measuring deflectometry for freeform specular surface metrology. OPTICS EXPRESS 2023;31:36557-36567. [PMID: 38017805 DOI: 10.1364/oe.504254] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/28/2023] [Accepted: 10/05/2023] [Indexed: 11/30/2023]
3
Wei X, Zhang H, Zou T, Wang Z. Three-dimensional stitching of stereo-deflectometry based on marker points. APPLIED OPTICS 2022;61:7323-7329. [PMID: 36256029 DOI: 10.1364/ao.464504] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/19/2022] [Accepted: 08/04/2022] [Indexed: 06/16/2023]
4
Quach H, Kang H, Jeong B, Choi H, Kim D. Non-planar illumination deflectometry for axicon metrology. OPTICS LETTERS 2022;47:3636-3639. [PMID: 35913280 DOI: 10.1364/ol.465046] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/26/2022] [Accepted: 06/30/2022] [Indexed: 06/15/2023]
5
Swain BR, Dorrer C, Qiao J. Telephoto-lens-based Optical Differentiation Wavefront Sensor for freeform metrology. OPTICS EXPRESS 2021;29:38395-38403. [PMID: 34808893 DOI: 10.1364/oe.443558] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/16/2021] [Accepted: 10/27/2021] [Indexed: 06/13/2023]
6
Utrera DG, Aguirre-Aguirre D, Rodríguez Rodríguez MI, Uribe RD. Null-screen testing of the complementary freeform surfaces of an adjustable focus lens. OPTICS EXPRESS 2021;29:21698-21710. [PMID: 34265951 DOI: 10.1364/oe.430320] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/28/2021] [Accepted: 06/14/2021] [Indexed: 06/13/2023]
7
Kim DW, Smith GA, Dubin M, Lowman A, Oh CJ, Quach H, Kang H, Yoo H, Trumper I, Graves L, Aftab M, Davila-Peralta C, Hyatt J, Choi H. Advances in reconfigurable optical design, metrology, characterization, and data analysis. JPHYS PHOTONICS 2021. [DOI: 10.1088/2515-7647/abde86] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]  Open
8
Niu Z, Zhang X, Ye J, Zhu Y, Xu M, Jiang X. Flexible one-shot geometric calibration for off-axis deflectometry. APPLIED OPTICS 2020;59:3819-3824. [PMID: 32400648 DOI: 10.1364/ao.388143] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/16/2020] [Accepted: 03/27/2020] [Indexed: 06/11/2023]
9
Willomitzer F, Yeh CK, Gupta V, Spies W, Schiffers F, Katsaggelos A, Walton M, Cossairt O. Hand-guided qualitative deflectometry with a mobile device. OPTICS EXPRESS 2020;28:9027-9038. [PMID: 32225516 DOI: 10.1364/oe.383475] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/21/2019] [Accepted: 02/18/2020] [Indexed: 06/10/2023]
10
Swain BR, Dorrer C, Qiao J. High-performance optical differentiation wavefront sensing towards freeform metrology. OPTICS EXPRESS 2019;27:36297-36310. [PMID: 31873412 DOI: 10.1364/oe.27.036297] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/22/2019] [Accepted: 10/10/2019] [Indexed: 06/10/2023]
11
Graves LR, Quach H, Koshel RJ, Oh CJ, Kim DW. High contrast thermal deflectometry using long-wave infrared time modulated integrating cavity source. OPTICS EXPRESS 2019;27:28660-28678. [PMID: 31684614 DOI: 10.1364/oe.27.028660] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/12/2019] [Accepted: 09/11/2019] [Indexed: 06/10/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA