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For: Xie Z, Tang Y, Feng J, Liu J, Hu S. Accurate surface profilometry using differential optical sectioning microscopy with structured illumination. Opt Express 2019;27:11721-11733. [PMID: 31053014 DOI: 10.1364/oe.27.011721] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/01/2019] [Accepted: 03/28/2019] [Indexed: 06/09/2023]
Number Cited by Other Article(s)
1
Motionless Polarizing Structured Illumination Microscopy. SENSORS 2021;21:s21082837. [PMID: 33920615 PMCID: PMC8073734 DOI: 10.3390/s21082837] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/29/2021] [Revised: 04/14/2021] [Accepted: 04/16/2021] [Indexed: 11/17/2022]
2
Choi G, Kim M, Kim J, Pahk HJ. Angle-resolved spectral reflectometry with a digital light processing projector. OPTICS EXPRESS 2020;28:26908-26921. [PMID: 32906956 DOI: 10.1364/oe.405204] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/14/2020] [Accepted: 08/19/2020] [Indexed: 06/11/2023]
3
Xie Z, Tang Y, He Y, Liu J, Feng J, Hu S. Fast structured illumination microscopy with reflectance disturbance resistibility and improved accuracy. OPTICS EXPRESS 2019;27:21508-21519. [PMID: 31510227 DOI: 10.1364/oe.27.021508] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/24/2019] [Accepted: 07/11/2019] [Indexed: 06/10/2023]
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