Highly sensitive transient reflection measurement in extreme ultraviolet region for tracking carrier and coherent phonon dynamics

High-sensitivity extreme-ultraviolet transient absorption spectroscopy enabled by machine learning

We present a novel denoising scheme for spectroscopy experiments employing broadband light sources and demonstrate its capabilities using transient absorption measurements with a high-harmonic source. Our scheme relies on measuring the probe spectra before and after interacting with the sample while capturing correlations between spectral components through machine learning approaches. With the present setup we achieve up to a tenfold improvement in noise suppression in XUV transient absorption spectra compared to the conventional pump on/ pump off referencing method. By utilizing strong spectral correlations in source fluctuations, the use of an artificial neural network facilitates pixel-wise noise reduction without requiring wavelength calibration of the reference spectrum. Our method can be adapted to a wide range of experiments and may be particularly advantageous for low repetition-rate systems, such as free electron lasers as well as laser-driven plasma and HHG sources. The enhanced sensitivity enables the investigation of subtle electron and lattice dynamics in the weak excitation regime, which is relevant for studying photovoltaics and photo-induced phase transitions in strongly correlated materials.

Absolute EUV reflectivity measurements using a broadband high-harmonic source and an in situ single exposure reference scheme

We present a tabletop setup for extreme ultraviolet (EUV) reflection spectroscopy in the spectral range from 40 to 100 eV by using high-harmonic radiation. The simultaneous measurements of reference and sample spectra with high energy resolution provide precise and robust absolute reflectivity measurements, even when operating with spectrally fluctuating EUV sources. The stability and sensitivity of EUV reflectivity measurements are crucial factors for many applications in attosecond science, EUV spectroscopy, and nano-scale tomography. We show that the accuracy and stability of our in situ referencing scheme are almost one order of magnitude better in comparison to subsequent reference measurements. We demonstrate the performance of the setup by reflective near-edge x-ray absorption fine structure measurements of the aluminum L_2/3 absorption edge in α-Al₂O₃ and compare the results to synchrotron measurements.

Electromagnetically induced modification of gold optical properties

The reflection of light from a metal film, i.e., a mirror, is among the most fundamental and well-understood effects in optics. If the film thickness is greater than the wavelength, reflection is strong and is explained in simple terms by the Fresnel equations. For film thickness much less than the wavelength, reflection is far weaker and more exotic effects become possible. This is especially so if the light illuminating the film is pulsed at the femtosecond time scale. In this work, a phenomenon is proposed where few-femtosecond laser pulses temporarily modify a thin metal film's optical properties via processes that appear linear and classical in nature. By casting a pulsed standing-wave pattern across the metal surface, we consider the possibility that conduction electrons are redistributed to create temporary regions of partly enhanced or reduced density without the excitation of inter-band transitions. The process would constitute a temporary change to the conductivity of the metal, and thus, may be observable as changes to the metal's transmittance and reflectance. In regions where the density is enhanced (reduced), the transmittance is decreased (increased). The concept is termed Electromagnetically Induced Modification (EIM) and is premised on the fact that the pulse length is shorter than the relaxation time of the conduction electrons. An experiment is conducted to test the concept by measuring the change in reflectance and transmittance of gold films with thickness ranging from 20-300 Angstrom. The results show that the film's transmittance decreases only when the standing-wave pattern is present. As the pulse length is increased, or as the film thickness is increased, the changes disappear. The changes show little dependence on the pulse intensity as it is varied by a factor of two. To gain further insight, the Drude theory is used to develop a simplified model for EIM, which qualitatively agrees with the observations. However, neither the experiment nor the model can prove the validity of the EIM concept. As such, an assessment is made for the potential of alternative well-known processes to explain the observations.