Carlsen M, Detlefs C, Yildirim C, Ræder T, Simons H. Simulating dark-field X-ray microscopy images with wavefront propagation techniques.
ACTA CRYSTALLOGRAPHICA SECTION A FOUNDATIONS AND ADVANCES 2022;
78:482-490. [PMID:
36318069 PMCID:
PMC9624181 DOI:
10.1107/s205327332200866x]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/01/2022] [Accepted: 08/30/2022] [Indexed: 11/07/2022]
Abstract
The simulation of a dark-field X-ray microscopy experiment using wavefront propagation techniques and numerical integration of the Takagi–Taupin equations is shown. The approach is validated by comparing with measurements of a near-perfect diamond crystal containing a single stacking-fault defect.
Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi–Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.
Collapse