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For: Waddie AJ, Schemmel PJ, Chalk C, Isern L, Nicholls JR, Moore AJ. Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location. Opt Express 2020;28:31535-31552. [PMID: 33115125 DOI: 10.1364/oe.398532] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/03/2020] [Accepted: 09/15/2020] [Indexed: 06/11/2023]
Number Cited by Other Article(s)
1
Kwon OT, Kim G, Bae H, Ryu J, Woo S, Cho BK. Development of a Mercury Bromide Birefringence Measurement System Based on Brewster's Angle. SENSORS (BASEL, SWITZERLAND) 2023;23:s23094208. [PMID: 37177412 PMCID: PMC10180884 DOI: 10.3390/s23094208] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/07/2023] [Revised: 04/10/2023] [Accepted: 04/21/2023] [Indexed: 05/15/2023]
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