Goldberger D, Schmidt D, Barolak J, Ivanic B, Durfee CG, Adams DE. Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography.
OPTICS EXPRESS 2021;
29:32474-32490. [PMID:
34615317 DOI:
10.1364/oe.433752]
[Citation(s) in RCA: 9] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/09/2021] [Accepted: 09/10/2021] [Indexed: 06/13/2023]
Abstract
Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, E~(x,y,z,ω), can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, E~(x,y,ω), from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses.
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