Meng Y, Fu C, Chen L, Du C, Zhong H, Wang Y, He J, Bao W. Submillimeter-spatial-resolution φ-OFDR strain sensor using femtosecond laser induced permanent scatters.
OPTICS LETTERS 2022;
47:6289-6292. [PMID:
37219229 DOI:
10.1364/ol.476349]
[Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/22/2022] [Accepted: 11/07/2022] [Indexed: 05/24/2023]
Abstract
A φ-optical frequency domain reflectometry (OFDR) strain sensor with a submillimeter-spatial-resolution of 233 µm is demonstrated by using femtosecond laser induced permanent scatters (PSs) in a standard single-mode fiber (SMF). The PSs-inscribed SMF, i.e., strain sensor, with an interval of 233 µm exhibited a Rayleigh backscattering intensity (RBS) enhancement of 26 dB and insertion loss of 0.6 dB. A novel, to the best of our knowledge, method, i.e., PSs-assisted φ-OFDR, was proposed to demodulate the strain distribution based on the extracted phase difference of P- and S-polarized RBS signal. The maximum measurable strain was up to 1400 µε at a spatial resolution of 233 µm.
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