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Dai D, Ciesielski R, Hoehl A, Kästner B, Siebenkotten D. Core-Shell Nanoparticle Resonances in Near-Field Microscopy Revealed by Fourier-Demodulated Full-Wave Simulations. NANO LETTERS 2024; 24:13747-13753. [PMID: 39405366 DOI: 10.1021/acs.nanolett.4c03940] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/01/2024]
Abstract
We present a detailed investigation of the near-field optical response of core-shell nanoparticles using Fourier-demodulated full-wave simulations, revealing significant modifications to established contrast mechanisms in infrared scattering-type scanning near-field optical microscopy (s-SNOM). Our work examined the complex interplay of geometrical and optical resonances within core-shell structures. Using a finite element method (FEM) simulation closely aligned with the actual s-SNOM measurement processes, we capture the specific near-field responses in these nanostructures. Our findings show that core-shell nanoparticles exhibit unexpected distinct resonance shifts and massively enhanced scattering driven by both the core and shell properties. This investigation not only advances the understanding of near-field interactions in complex nanosystems but also provides a refined theoretical framework to accurately predict the optical signatures of nanostructures with internal heterogeneity.
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Affiliation(s)
- Dinghe Dai
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
| | - Richard Ciesielski
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
| | - Arne Hoehl
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
| | - Bernd Kästner
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
| | - Dario Siebenkotten
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
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Németh G, Bechtel HA, Borondics F. Origins and consequences of asymmetric nano-FTIR interferograms. OPTICS EXPRESS 2024; 32:15280-15294. [PMID: 38859183 DOI: 10.1364/oe.520793] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/08/2024] [Accepted: 03/18/2024] [Indexed: 06/12/2024]
Abstract
Infrared scattering-type near-field optical microscopy, IR s-SNOM, and its broadband variant, nano-FTIR, are pioneering, flagship techniques for their ability to provide molecular identification and material optical property information at a spatial resolution well below the far-field diffraction limit, typically less than 25 nm. While s-SNOM and nano-FTIR instrumentation and data analysis have been discussed previously, there is a lack of information regarding experimental parameters for the practitioner, especially in the context of previously developed frameworks. Like conventional FTIR spectroscopy, the critical component of a nano-FTIR instrument is an interferometer. However, unlike FTIR spectroscopy, the resulting interference patterns or interferograms are typically asymmetric. Here, we unambiguously describe the origins of asymmetric interferograms recorded with nano-FTIR instruments, give a detailed analysis of potential artifacts, and recommend optimal instrument settings as well as data analysis parameters.
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Ge S, Zhang D, Peng Z, Meng J. Rough surface effect in terahertz near-field microscopy: 3D simulation analysis. APPLIED OPTICS 2023; 62:6333-6342. [PMID: 37706823 DOI: 10.1364/ao.496849] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/31/2023] [Accepted: 07/25/2023] [Indexed: 09/15/2023]
Abstract
Terahertz scattering-type scanning near-field optical microscopy (THz-s-SNOM) has emerged as a powerful technique for high-resolution imaging. However, most previous studies have focused on simplified smooth surface models, overlooking the realistic surface roughness induced by contamination during sample preparation. In this work, we present a novel 3D model, to the best of our knowledge, that combines the point dipole model with the finite element method to investigate the influence of sample morphology on scattered signals. We explore surfaces with a protrusion, a depression, and random roughness, characterizing the variations in scattered signals and highlighting the role of higher-order scattering in mitigating surface roughness effects. Our findings provide valuable insights into the impact of sample morphology on THz-s-SNOM imaging.
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Stanciu SG, Tranca DE, Zampini G, Hristu R, Stanciu GA, Chen X, Liu M, Stenmark HA, Latterini L. Scattering-type Scanning Near-Field Optical Microscopy of Polymer-Coated Gold Nanoparticles. ACS OMEGA 2022; 7:11353-11362. [PMID: 35415325 PMCID: PMC8992282 DOI: 10.1021/acsomega.2c00410] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/20/2022] [Accepted: 03/07/2022] [Indexed: 05/14/2023]
Abstract
Scattering-type scanning near-field optical microscopy (s-SNOM) has emerged over the past years as a powerful characterization tool that can probe important properties of advanced materials and biological samples in a label-free manner, with spatial resolutions lying in the nanoscale realm. In this work, we explore such usefulness in relationship with an interesting class of materials: polymer-coated gold nanoparticles (NPs). As thoroughly discussed in recent works, the interplay between the Au core and the polymeric shell has been found to be important in many applications devoted to biomedicine. We investigate bare Au NPs next to polystyrenesulfonate (PSS) and poly(diallyldimethylammonium chloride) (PDDA) coated ones under 532 nm laser excitation, an wavelength matching the surface plasmon band of the custom-synthesized nanoparticles. We observe consistent s-SNOM phase signals in the case of bare and shallow-coated Au NPs, whereas for thicker shell instances, these signals fade. For all investigated samples, the s-SNOM amplitude signals were found to be very weak, which may be related to reduced scattering efficiency due to absorption of the incident beam. We consider these observations important, as they may facilitate studies and applications in nanomedicine and nanotechnology where the precise positioning of polymer-coated Au NPs with nanoscale resolution is needed besides their dielectric function and related intrinsic optical properties, which are also quantitatively available with s-SNOM.
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Affiliation(s)
- Stefan G. Stanciu
- Center
for Microscopy-Microanalysis and Information Processing, Politehnica University of Bucharest, Bucharest, 060042, Romania
| | - Denis E. Tranca
- Center
for Microscopy-Microanalysis and Information Processing, Politehnica University of Bucharest, Bucharest, 060042, Romania
| | - Giulia Zampini
- Department
of Chemistry, Biology and Biotechnology, Perugia University, Via Elce di sotto, 8, 06123 Perugia, Italy
| | - Radu Hristu
- Center
for Microscopy-Microanalysis and Information Processing, Politehnica University of Bucharest, Bucharest, 060042, Romania
| | - George A. Stanciu
- Center
for Microscopy-Microanalysis and Information Processing, Politehnica University of Bucharest, Bucharest, 060042, Romania
| | - Xinzhong Chen
- Department
of Physics and Astronomy, Stony Brook University, Stony Brook, New York 11794, United States
| | - Mengkun Liu
- Department
of Physics and Astronomy, Stony Brook University, Stony Brook, New York 11794, United States
- National
Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States
| | - Harald A. Stenmark
- Department
of Molecular Cell Biology, Institute for Cancer Research, Oslo University Hospital, Oslo 0379, Norway
| | - Loredana Latterini
- Department
of Chemistry, Biology and Biotechnology, Perugia University, Via Elce di sotto, 8, 06123 Perugia, Italy
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Chen X, Yao Z, Sun Z, Stanciu SG, Basov DN, Hillenbrand R, Liu M. Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces - part II. OPTICS EXPRESS 2022; 30:11228-11242. [PMID: 35473071 DOI: 10.1364/oe.452949] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/05/2022] [Accepted: 02/11/2022] [Indexed: 06/14/2023]
Abstract
The modeling of the near-field interaction in the scattering-type scanning near-field optical microscope (s-SNOM) is rapidly advancing, although an accurate yet versatile modeling framework that can be easily adapted to various complex situations is still lacking. In this work, we propose a time-efficient numerical scheme in the quasi-electrostatic limit to capture the tip-sample interaction in the near field. This method considers an extended tip geometry, which is a significant advantage compared to the previously reported method based on the point-dipole approximation. Using this formalism, we investigate, among others, nontrivial questions such as uniaxial and biaxial anisotropy in the near-field interaction, the relationship between various experimental parameters (e.g. tip radius, tapping amplitude, etc.), and the tip-dependent spatial resolution. The demonstrated method further sheds light on the understanding of the contrast mechanism in s-SNOM imaging and spectroscopy, while also representing a valuable platform for future quantitative analysis of the experimental observations.
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