Bilayer-film-decorated microsphere with suppressed interface reflection for enhanced nano-imaging

Wave optics of imaging with contact ball lenses

Recent progress in microspherical superlens nanoscopy raises a fundamental question about the transition from super-resolution properties of mesoscale microspheres, which can provide a subwavelength resolution [Formula: see text], to macroscale ball lenses, for which the imaging quality degrades because of aberrations. To address this question, this work develops a theory describing the imaging by contact ball lenses with diameters [Formula: see text] covering this transition range and for a broad range of refractive indices [Formula: see text]. Starting from geometrical optics we subsequently proceed to an exact numerical solution of the Maxwell equations explaining virtual and real image formation as well as magnification M and resolution near the critical index [Formula: see text] which is of interest for applications demanding the highest M such as cellphone microscopy. The wave effects manifest themselves in a strong dependence of the image plane position and magnification on [Formula: see text], for which a simple analytical formula is derived. It is demonstrated that a subwavelength resolution is achievable at [Formula: see text]. The theory explains the results of experimental contact-ball imaging. The understanding of the physical mechanisms of image formation revealed in this study creates a basis for developing applications of contact ball lenses in cellphone-based microscopy.

Microsphere-assisted dark-field microscopy based on a fully immersed low refractive index microsphere

Here we find that a fully immersed low refractive index SiO₂ microsphere (or a microcylinder, a yeast cell) can clearly distinguish a sample with sub-diffraction features in dark-field illumination mode. The resolvable area of the sample by microsphere-assisted microscopy (MAM) is composed of two regions. One region locates below the microsphere, and a virtual image of this part of the sample is formed by the microsphere first and then the virtual image is received by the microscope. The other region is around the edge of the microsphere, and this part of the sample is directly imaged by the microscope. The simulated region of the enhanced electric field on the sample surface formed by the microsphere is consistent with the resolvable region in the experiment. Our studies show that the enhanced electric field on the sample surface generated by the fully immersed microsphere plays an important role in dark-field MAM imaging, and this finding will have a positive effect on exploring novel mechanisms in resolution improvement of MAM.

Focusing light with a metal film coated patchy particle

Microsphere-assisted super-resolution imaging is a promising technique that can significantly enhance the resolution of conventional optical microscopes. The focus of a classical microsphere is called photonic nanojet, which is a symmetric high-intensity electromagnetic field. Recently, patchy microspheres have been reported to have superior imaging performance than pristine microspheres, and coating microspheres with metal films leads to the formation of photonic hooks, which can enhance the imaging contrast of microspheres. Understanding the influence of metal patches on the near-field focusing of patchy particles is important for the rational design of a nanostructured microlens. In this work, we theoretically and experimentally showed that the light waves can be focused and engineered using patchy particles. When coating dielectric particles with Ag films, light beams with a hook-like structure or S-shaped structure can be generated. Simulation results show that the waveguide ability of metal films and the geometric asymmetry of patchy particles cause the formation of S-shaped light beams. Compared with classical photonic hooks, S-shaped photonic hooks have a longer effective length and a smaller beam waist at far-field region. Experiments were also carried out to demonstrate the generation of classical and S-shaped photonic hooks from patchy microspheres.

Sub-50 nm optical imaging in ambient air with 10× objective lens enabled by hyper-hemi-microsphere

Optical microsphere nanoscope has great potential in the inspection of integrated circuit chips for semiconductor industry and morphological characterization in biology due to its superior resolving power and label-free characteristics. However, its resolution in ambient air is restricted by the magnification and numerical aperture (NA) of microsphere. High magnification objective lens is required to be coupled with microsphere for nano-imaging beyond the diffraction limit. To overcome these challenges, in this work, high refractive index hyper-hemi-microspheres with tunable magnification up to 10× are proposed and realized by accurately tailoring their thickness with focused ion beam (FIB) milling. The effective refractive index is put forward to guide the design of hyper-hemi-microspheres. Experiments demonstrate that the imaging resolution and contrast of a hyper-hemi-microsphere with a higher magnification and larger NA excel those of a microsphere in air. Besides, the hyper-hemi-microsphere could resolve ~50 nm feature with higher image fidelity and contrast compared with liquid immersed high refractive index microspheres. With a hyper-hemi-microsphere composed microscale compound lens configuration, sub-50 nm optical imaging in ambient air is realized by only coupling with a 10× objective lens (NA = 0.3), which enhances a conventional microscope imaging power about an order of magnitude.

Imaging properties of microsphere superlenses with varying background refractive indices under inclined illumination

Microsphere lenses can overcome the optical diffraction limit and can be used to observe features smaller than 200 nm under white light. Inclined illumination benefits from the second refraction of evanescent waves in the microsphere cavity, prohibiting the influence of background noise and improving the imaging resolution and quality of the microsphere superlens. Currently, there is a consensus that microspheres immersed in a liquid environment can improve imaging quality. Microsphere imaging under inclined illumination is performed using barium titanate microspheres immersed in an aqueous environment. However, the background medium of a microlens varies depending on its diverse applications. In this study, the effects of continuously changing background media on the imaging properties of microsphere lens under inclined illumination are investigated. The experimental results demonstrate that the axial position of the microsphere photonic nanojet changes with respect to the background medium. Consequently, owing to the refractive index of the background medium, the imaging magnification and the position of the virtual image change. Using a sucrose solution and polydimethylsiloxane with the same refractive index, we demonstrate that the imaging performance of microspheres is related to the refractive index rather than the background medium type. This study helps associate microsphere superlenses with a more universal application spectrum.

Optical microscope with a large tilt angle and a long focal length for a nano-size angle-resolved photoemission spectroscopy

Angle-resolved photoemission spectroscopy with nanoscale spatial resolution (Nano-ARPES) is a powerful tool for the investigation of electronic structures of materials and their spatial configurations. In order to capture the area of interest in Nano-ARPES measurements effectively, an optical microscope can be used to provide real space optical images as a reference. In this work, a new type of optical microscope for Nano-APRES spectrometer with a large tilt angle of ∼30 degrees and a long focal length of ∼12 mm has been designed. Large magnifications by 7 × to 20 × and a spatial resolution of 3 um have been achieved, which can effectively assist optical alignment for Nano-ARPES. In addition, the strong boundary sensitivity observed in such a tilt design demonstrates its special capability in detecting the fine features of surface coarseness.