Resolution limit in opto-digital systems revisited

Generalization of the two-point-source resolution criterion in the presence of noise

The two-point-source resolution criterion is widely used to quantify the performance of imaging systems. The two main approaches for the computation of the two-point-source resolution are the detection theoretic and visual analyses. The first assumes a shift-invariant system and lacks the ability to incorporate two different point spread functions (PSFs), which may be required in certain situations like computing axial resolution. The latter approach, which includes the Rayleigh criterion, relies on the peak-to-valley ratio and does not properly account for the presence of noise. We present a heuristic generalization of the visual two-point-source resolution criterion using Gaussian processes (GP). This heuristic criterion is applicable to both shift-invariant and shift-variant imaging modalities. This criterion can also incorporate different definitions of resolution expressed in terms of varying peak-to-valley ratios. Our approach implicitly incorporates information about noise statistics such as the variance or signal-to-noise ratio by making assumptions about the spatial correlation of PSFs in the form of kernel functions. Also, it does not rely on an analytic form of the PSF.

High-detection-efficiency stereo microscope system based on a mobile phone

Most stereoscopic microscopes used for industrial component detection are large and have low detection efficiencies. The use of mobile phones as imaging systems (rather than conventional sensors) in industrial fields would make industrial testing more convenient. In this study, an external stereo microscope for mobile phones is designed. The proposed system can resolve details up to 0.01 mm with an 11 mm object field of view, -6.34× angular magnification, and quantitative 3D feature measurement. The combined system proposed in this paper is suitable for the microscopic observation of industrial components, with its low cost, high detection efficiency, and short installation steps.

Practical guide for setting up a Fourier light-field microscope

A practical guide for the easy implementation of a Fourier light-field microscope is reported. The Fourier light-field concept applied to microscopy allows the capture in real time of a series of 2D orthographic images of microscopic thick dynamic samples. Such perspective images contain spatial and angular information of the light-field emitted by the sample. A feature of this technology is the tight requirement of a double optical conjugation relationship, and also the requirement of NA matching. For these reasons, the Fourier light-field microscope being a non-complex optical system, a clear protocol on how to set up the optical elements accurately is needed. In this sense, this guide is aimed to simplify the implementation process, with an optical bench and off-the-shelf components. This will help the widespread use of this recent technology.

Focus Issue Introduction: 3D Image Acquisition and Display: Technology, Perception and Applications

This Feature Issue of Optics Express is organized in conjunction with the 2022 Optica conference on 3D Image Acquisition and Display: Technology, Perception and Applications which was held in hybrid format from 11 to 15, July 2022 as part of the Imaging and Applied Optics Congress and Optical Sensors and Sensing Congress 2022 in Vancouver, Canada. This Feature Issue presents 31 articles which cover the topics and scope of the 2022 3D Image Acquisition and Display conference. This Introduction provides a summary of these published articles that appear in this Feature Issue.