Soft-x-ray interferometer for single-shot laser linewidth measurements

Monitoring shot-to-shot variations of soft x-ray sources using aluminum foils

We report a straightforward beam splitter in the soft x-ray spectral range using a thin oxidized aluminum foil. As it allows us to monitor reliably shot-to-shot variations in energy and in energy distribution, this beam splitter is of high interest for the simultaneous use of diagnostics for soft x-rays sources. We measure a transmission of 0.5 and a reflectivity of 0.018 at 22.5° of incidence with a soft x-ray laser working at 32.8 nm. These values are in good agreement with the theory. As the theory predicts a reflectivity and a transmission of both 12% at 52.5° of incidence for 32.8 nm, it can also be useful for experiments that require the division and recombination of a beam, for instance, interferometry or pump-probe technique with an intense soft x-ray source.

Design of a phase-shifting interferometer in the extreme ultraviolet for high-precision metrology

The design of a phase-shift interferometer in the extreme ultraviolet (EUV) is described. The interferometer is expected to achieve a significantly higher precision as compared with similar instruments that utilize lasers in the visible range. The interferometer's design is specifically adapted for its utilization with a table top pulsed capillary discharge EUV laser. The numerical model evaluates the errors in the interferograms and in the retrieved wavefront induced by the shot-to-shot fluctuations and pointing instabilities of the laser.

Single-shot soft x-ray laser linewidth measurement using a grating interferometer

The linewidth of a 14.7 nm wavelength Ni-like Pd soft x-ray laser was measured in a single shot using a soft x-ray diffraction grating interferometer. The instrument uses the time delay introduced by the gratings across the beam to measure the temporal coherence. The spectral linewidth of the 4d1S0-4p1P1 Ni-like Pd lasing line was measured to be Δλ/λ=3×10(-5) from the Fourier transform of the fringe visibility. This single shot linewidth measurement technique provides a rapid and accurate way to determine the temporal coherence of soft x-ray lasers that can contribute to the development of femtosecond plasma-based soft x-ray lasers.

Soft X-ray holographic grating beam splitter including a double frequency grating for interferometer pre-alignment

Grating beam splitters have been fabricated for soft X-ray Mach- Zehnder interferometer using holographic interference lithography. The grating beam splitter consists of two gratings, one works at X-ray laser wavelength of 13.9 nm with the spatial frequency of 1000 lines/mm as the operation grating, the other works at visible wavelength of 632.8 nm for pre-aligning the X-ray interferometer with the spatial frequency of 22 lines/mm as the pre-alignment grating. The two gratings lie vertically on the same substrate. The main feature of the beam splitter is the use of low-spatial- frequency beat grating of a holographic double frequency grating as the pre-alignment grating of the X-ray interferometer. The grating line parallelism between the two gratings can be judged by observing the diffraction patterns of the pre-alignment grating directly.

Bandwidth enhancement of electro-optic field sensing using photonic down-mixing with harmonic sidebands

We demonstrate that harmonic sidebands of an electro-optic modulator's driving frequency can be used as the local oscillator in a photonic down-mixing process in order to significantly enhance the bandwidth of near-field, electro-optic, microwave measurements. The creation of second- and third-order-harmonic modulation sidebands on a laser-diode output are described, with heterodyne down-conversion of microwave signals taking place within an electro-optic sensor crystal. The measurement bandwidth of an electro-optic microwave probe can thus be enhanced by as much as a factor of three with respect to the use of conventional, fundamental-harmonic sidebands. Carrier-sideband analysis from the measured optical spectrum indicates that millimeter-wave-frequency local-oscillator sidebands can be created using a Ku-band electro-optic modulator and that the electro-optic-signal-modulation depth can be enhanced by suppressing the light-beam carrier component. Transverse near-field distributions from high frequency patch antennas are extracted using both second- and third-order-harmonic sidebands.

Picosecond-resolution soft-x-ray laser plasma interferometry

We describe a soft-x-ray laser interferometry technique that allows two-dimensional diagnosis of plasma electron density with picosecond time resolution. It consists of the combination of a robust high-throughput amplitude-division interferometer and a 14.7-nm transient-inversion soft-x-ray laser that produces approximately 5-ps pulses. Because of its picosecond resolution and short-wavelength scalability, this technique has the potential for extending the high inherent precision of soft-x-ray laser interferometry to the study of very dense plasmas of significant fundamental and practical interest, such as those investigated for inertial confinement fusion. Results of its use in the diagnostics of dense large-scale laser-created plasmas are presented.

Dense plasma diagnostics with an amplitude-division soft-x-ray laser interferometer based on diffraction gratings

We report the demonstration of an amplitude-division soft-x-ray interferometer that can be used to generate high-contrast interferograms at the wavelength of any of the saturated soft-x-ray lasers (5.6-46.9 nm) that are available at present. The interferometer, which utilizes grazing-incidence diffraction gratings as beam splitters in a modified Mach-Zehnder configuration, was used in combination with a tabletop 46.9-nm laser to probe a large-scale (~2.7-mm-long) laser-created plasma.

Soft-x-ray laser interferometry of a pinch discharge using a tabletop laser

We have used a tabletop soft-x-ray laser and a wave-front division interferometer to probe the plasma of a pinch discharge. A very compact capillary discharge-pumped Ne-like Ar laser emitting at 46.9 nm was combined with a wave division interferometer based on Lloyd's mirror and Sc-Si multilayer-coated optics to map the electron density in the cathode region of the discharge. This demonstration of the use of tabletop soft-x-ray laser in plasma interferometry could lead to the widespread use of these lasers in the diagnostics of dense plasmas.

Soft-x-ray laser interferometry of a plasma with a tabletop laser and a Lloyd's mirror

We report what is believed to be the first demonstration of soft-x-ray interferometry of a plasma with a tabletop soft-x-ray laser. A Lloyd's mirror interferometer was used in combination with a very compact lambda = 46.9 nm capillary-discharge-pumped laser to map the electron density in the cathode region of a pinch plasma.

High-reflectivity multilayer mirrors for a vacuum-ultraviolet interval of 35-50nm

Sc-Si multilayers are suggested as high-reflectivity coatings for a VUV interval of 35-50 nm. Fabricated mirrors show normal-incidence reflectivity of 30-54%, which is high enough for effective manipulation of the beams of compact-discharge, laser-driven x-ray lasers. The values obtained are not, however, limits for Sc-Si coatings. Theoretical estimations as well as electron microscopy studies of Sc-Si interfaces indicate a large potential for a further increase in their reflectivity.