4Pi confocal optical system with phase conjugation

Three-dimensional observation of internal defects in semiconductor crystals by use of two-photon excitation

We present a method of three-dimensional observation of internal defects in semiconductor crystals for blue lasers by use of two-photon excitation. We excite photoluminescence by using a two-photon process. Since semiconductor materials have intrinsically high absorption in the short-wavelength region, the excitation light of photoluminescence is largely absorbed by the crystals. It is difficult to observe defects in deep regions. Two-photon excitation can overcome this limitation because near-infrared light can be used instead of blue light for excitation of photoluminescence, and the near-infrared light is absorbed at only the focused point. The excitation light can penetrate into the deep regions of the crystal. We succeeded in observing defects in a ZnSe crystal ~200 microm below the crystal surface. This is, as far as we know, the first demonstration of the observation of three-dimensional structures of defects in semiconductor crystals by the use of two-photon excitation.

Resolution enhancement in a reflection-type confocal microscope with a phase-conjugate mirror

Theoretical and experimental results for a new reflection-type confocal microscope with a phase-conjugate mirror (PCM) are presented. The microscope achieves better lateral and axial resolution than the conventional confocal microscope. The observation volume is reduced considerably (approximately 63%). Owing to the properties of the PCM, the system is self-aligning.

Image formation and data acquisition in a stage scanning 4Pi confocal fluorescence microscope

We describe the three-dimensional (3-D) image formation and data acquisition in a stage scanning 4Pi confocal fluorescence microscope with the use of two-photon excitation. The 3-D point-spread functions of the 4Pi confocal and regular confocal microscope are measured and compared. Particular emphasis is given to the data acquisition procedure. 4Pi confocal microscopy results in a point-spread function that is 4 times sharper than that of a regular confocal microscope, ultimately leading to superior 3-D imaging of translucent fluorescent specimens. For a two-photon excitation wavelength of approximately 800 nm, we obtain an axial resolution of 140 nm.