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For: Baker KL, Brase J, Kartz M, Olivier SS, Sawvel B, Tucker J. Electron density characterization by use of a broadband x-ray-compatible wave-front sensor. Opt Lett 2003;28:149-151. [PMID: 12656314 DOI: 10.1364/ol.28.000149] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
Number Cited by Other Article(s)
1
High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor. CONDENSED MATTER 2021. [DOI: 10.3390/condmat7010003] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
2
Koch JA, Landen OL, Suter LJ, Masse LP, Clark DS, Ross JS, Mackinnon AJ, Meezan NB, Thomas CA, Ping Y. Refraction-enhanced backlit imaging of axially symmetric inertial confinement fusion plasmas. APPLIED OPTICS 2013;52:3538-3556. [PMID: 23736240 DOI: 10.1364/ao.52.003538] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/12/2013] [Accepted: 04/12/2013] [Indexed: 06/02/2023]
3
Mayo SC, Sexton B. Refractive microlens array for wave-front analysis in the medium to hard x-ray range. OPTICS LETTERS 2004;29:866-868. [PMID: 15119404 DOI: 10.1364/ol.29.000866] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
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