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Zhang W, Li B, Chang C, Chen F, Zhang Q, Lin Q, Wang L, Yan J, Wang F, Chong Y, Du Z, Fan F, Shen H. Stable and efficient pure blue quantum-dot LEDs enabled by inserting an anti-oxidation layer. Nat Commun 2024; 15:783. [PMID: 38278797 PMCID: PMC10817946 DOI: 10.1038/s41467-024-44894-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/14/2023] [Accepted: 01/09/2024] [Indexed: 01/28/2024] Open
Abstract
The efficiency and stability of red and green quantum-dot light-emitting diodes have already met the requirements for commercialization in displays. However, the poor stability of the blue ones, particularly pure blue color, is hindering the commercialization of full-color quantum-dot light-emitting diode technology. Severe hole accumulation at the blue quantum-dot/hole-transport layer interface makes the hole-transport layer prone to oxidation, limiting the device operational lifetime. Here, we propose inserting an anti-oxidation layer (poly(p-phenylene benzobisoxazole)) between this interface to take in some holes from the hole-transport layer, which mitigates the oxidation-induced device degradation, enabling a T50 (time for the luminance decreasing by 50%) of more than 41,000 h with an initial brightness of 100 cd m-2 in pure blue devices. Meanwhile, the inserted transition layer facilitates hole injection and helps reduce electron leakage, leading to a peak external quantum efficiency of 23%.
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Affiliation(s)
- Wenjing Zhang
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Bo Li
- Hefei National Laboratory for Physical Sciences at the Microscale and Department of Modern Physics, CAS Key Laboratory of Microscale Magnetic Resonance, Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, 230026, Hefei, China
| | - Chun Chang
- Key Laboratory of Nondestructive Testing Ministry of Education, Nanchang Hangkong University, 330063, Nanchang, China
| | - Fei Chen
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China.
| | - Qin Zhang
- Key Laboratory of Nondestructive Testing Ministry of Education, Nanchang Hangkong University, 330063, Nanchang, China
| | - Qingli Lin
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Lei Wang
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Jinhang Yan
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Fangfang Wang
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Yihua Chong
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Zuliang Du
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China
| | - Fengjia Fan
- Hefei National Laboratory for Physical Sciences at the Microscale and Department of Modern Physics, CAS Key Laboratory of Microscale Magnetic Resonance, Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, 230026, Hefei, China.
| | - Huaibin Shen
- Key Laboratory for Special Functional Materials of Ministry of Education, National & Local Joint Engineering Research Center for High-efficiency Display and Lighting Technology, Henan University, 475004, Kaifeng, China.
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Lyu B, Hu J, Chen Y, Ma Z. Spectra Stable Quantum Dots Enabled by Band Engineering for Boosting Electroluminescence in Devices. MICROMACHINES 2022; 13:1315. [PMID: 36014239 PMCID: PMC9416132 DOI: 10.3390/mi13081315] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/05/2022] [Revised: 08/12/2022] [Accepted: 08/12/2022] [Indexed: 06/15/2023]
Abstract
The band level landscape in quantum dots is of great significance toward achieving stable and efficient electroluminescent devices. A series of quantum dots with specific emission and band structure of the intermediate layer is designed, including rich CdS (R-CdS), thick ZnSe (T-ZnSe), thin ZnSe (t-ZnSe) and ZnCdS (R-ZnCdS) intermediate alloy shell layers. These quantum dots in QLEDs show superior performance, including maximum current efficiency, external quantum efficiencies and a T50 lifetime (at 1000 cd/m2) of 47.2 cd/A, 11.2% and 504 h for R-CdS; 61.6 cd/A, 14.7% and 612 h for t-ZnSe; 70.5 cd/A, 16.8% and 924 h for T-ZnSe; and 82.0 cd/A, 19.6% and 1104 h for R-ZnCdS. Among them, the quantum dots with the ZnCdS interlayer exhibit deep electron confinement and shallow hole confinement capabilities, which facilitate the efficient injection and radiative recombination of carriers into the emitting layer. Furthermore, the optimal devices show a superior T50 lifetime of more than 1000 h. The proposed novel methodology of quantum dot band engineering is expected to start a new way for further enhancing QLED exploration.
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Affiliation(s)
- Bingbing Lyu
- School of Physics, Harbin Institute of Technology, Harbin 150001, China
| | - Junxia Hu
- School of Information Engineering, Xinyang Agriculture and Forestry University, Xinyang 464000, China
| | - Yani Chen
- Institute for Advanced Study, Shenzhen University, Shenzhen 518060, China
| | - Zhiwei Ma
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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Zhang D, Xu J. Enhancing extraction efficiency of quantum dot light-emitting diodes introducing a highly wrinkled ZnO electron transport layer. OPTICS LETTERS 2020; 45:2243-2246. [PMID: 32287204 DOI: 10.1364/ol.390266] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/11/2020] [Accepted: 03/06/2020] [Indexed: 06/11/2023]
Abstract
Light extraction efficiency is crucial for achieving highly efficient and bright quantum dot light-emitting diodes (QLEDs), and current efforts toward introducing light outcoupling nanostructures always require complicated procedures. An extremely simple and efficient method to introduce light outcoupling nanostructures in the ZnO electron transport layer (ETL) is demonstrated by adopting a certain heating rate during the annealing process. The ultimate device exhibits a current efficiency of 9.1 cd/A, giving a 50% efficiency improvement compared to the control device with a flat ZnO ETL. This arises from the increased light extraction efficiency induced by random nanostructures formed on a wrinkled ZnO ETL, which could also be modulated by adjusting the heating rate during the annealing process. This study not only provides a simple and efficient method to introduce light outcoupling nanostructures, but also shows ample room for further performance enhancement of QLEDs with the guideline of light extraction.
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