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Liu X, Huang S, Li C. Color image information transmission based on elliptic optical vortex array encoding/decoding. OPTICS EXPRESS 2023; 31:29755-29767. [PMID: 37710769 DOI: 10.1364/oe.497808] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2023] [Accepted: 08/11/2023] [Indexed: 09/16/2023]
Abstract
A multichannel high-dimensional data encoding/decoding scheme based on composite elliptic optical vortex (EOV) arrays is proposed. By exploiting the rotation angle of the EOV, a 4 × 4 composite EOV array is used for high-dimensional data encoding. The conjugate symmetric extension Fourier computer-generated holography algorithm with controllable reconstruction focus is used to assign different reconstruction focus to the data of the three channels (R, G, and B) of the color image. Then, the data of the three channels is transmitted simultaneously by a single hologram to further improve the transmission efficiency. At the receiver, the initial information sequence is decoded by directly identifying the captured intensity patterns with a deep learning-based convolutional neural network. In the experiment, a 128 × 128-pixel color image is successfully transmitted, which confirms the feasibility of our proposed encoding/decoding scheme. This method has great potential for future high-capacity optical communications.
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Kang X, Shan X, Chen K, Sun X, Wang G, Gao X, Liu Y, Zhuang S. Generation of vector elliptical perfect optical vortices with mixed modes in free space. OPTICS EXPRESS 2023; 31:15179-15188. [PMID: 37157365 DOI: 10.1364/oe.489196] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
Abstract
Vector vortex beams are widely used because of their anisotropic vortex polarization state and spiral phase. Constructing mixed mode vector vortex beams in free space still requires complex designs and calculations. We propose a method for generating mixed mode vector Elliptical perfect optical vortex (EPOV) arrays in free space by mode extraction and optical pen. It is demonstrated that the long axis and short axis of EPOVs are not limited by the topological charge (TC). Flexible modulation of parameters in the array is achieved, including number, position, ellipticity, ring size, TC, and polarization mode. This approach is simple and effective, it will provide a powerful optical tool for optical tweezers, particle manipulation, and optical communication.
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You X, Liu J, Li Y, Jiang Y, Liu J. 3D microscopy in industrial measurements. J Microsc 2023; 289:137-156. [PMID: 36427335 DOI: 10.1111/jmi.13161] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/05/2022] [Revised: 11/19/2022] [Accepted: 11/21/2022] [Indexed: 11/27/2022]
Abstract
Quality control is essential to ensure the performance and yield of microdevices in industrial processing and manufacturing. In particular, 3D microscopy can be considered as a separate branch of microscopic instruments and plays a pivotal role in monitoring processing quality. For industrial measurements, 3D microscopy is mainly used for both the inspection of critical dimensions to ensure the design performance and detection of defects for improving the yield of microdevices. However, with the progress of advanced manufacturing technology and the increasing demand for high-performance microdevices, 3D microscopy has ushered in new challenges and development opportunities, such as breakthroughs in diffraction limit, 3D characterisation and calibrations of critical dimensions, high-precision detection and physical property determination of defects, and application of artificial intelligence. In this review, we provide a comprehensive survey about the state of the art and challenges in 3D microscopy for industrial measurements, and provide development ideas for future research. By describing techniques and methods with their advantages and limitations, we provide guidance to researchers and developers about the most suitable technique available for their intended industrial measurements.
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Affiliation(s)
- Xiaoyu You
- Advanced Microscopy and Instrumentation Research Centre, Harbin Institute of Technology, Harbin, Heilongjiang, China.,State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Lab of Ultra-Precision Intelligent Instrumentation Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Laboratory of Microsystems and Microstructures Manufacturing Ministry of Education, Harbin Institute of Technology, Harbin, Heilongjiang, China
| | - Jing Liu
- Advanced Microscopy and Instrumentation Research Centre, Harbin Institute of Technology, Harbin, Heilongjiang, China.,State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Lab of Ultra-Precision Intelligent Instrumentation Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Laboratory of Microsystems and Microstructures Manufacturing Ministry of Education, Harbin Institute of Technology, Harbin, Heilongjiang, China
| | - Yifei Li
- Advanced Microscopy and Instrumentation Research Centre, Harbin Institute of Technology, Harbin, Heilongjiang, China.,State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Lab of Ultra-Precision Intelligent Instrumentation Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Laboratory of Microsystems and Microstructures Manufacturing Ministry of Education, Harbin Institute of Technology, Harbin, Heilongjiang, China
| | - Yong Jiang
- Advanced Microscopy and Instrumentation Research Centre, Harbin Institute of Technology, Harbin, Heilongjiang, China.,State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Lab of Ultra-Precision Intelligent Instrumentation Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Laboratory of Microsystems and Microstructures Manufacturing Ministry of Education, Harbin Institute of Technology, Harbin, Heilongjiang, China
| | - Jian Liu
- Advanced Microscopy and Instrumentation Research Centre, Harbin Institute of Technology, Harbin, Heilongjiang, China.,State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Lab of Ultra-Precision Intelligent Instrumentation Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, Heilongjiang, China.,Key Laboratory of Microsystems and Microstructures Manufacturing Ministry of Education, Harbin Institute of Technology, Harbin, Heilongjiang, China
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Hua Z, Liu J, Liu C. High-resolution dark-field confocal microscopy based on radially polarized illumination. OPTICS EXPRESS 2022; 30:11066-11078. [PMID: 35473058 DOI: 10.1364/oe.451507] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/17/2021] [Accepted: 03/04/2022] [Indexed: 06/14/2023]
Abstract
Dark-field confocal microscopy (DFCM) facilitates the 3D detection and localization of surface and subsurface defects in high-precision optical components. The spatial resolution of conventional DFCM is commonly undermined owing to complementary aperture detection. We employed a radially polarized (RP) beam for illumination in DFCM. The RP beam creates a sub-diffraction-sized longitudinal optical component after being focused and effectively enhances the lateral resolution by 30.33% from 610 nm to 425 nm. The resolution improvement was verified by imaging a 2D sample containing sparsely distributed gold nanorods along with a 3D neodymium glass containing surface and subsurface defects.
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