Genome-wide association mapping reveals race-specific SNP markers associated with anthracnose resistance in carioca common beans

Screening for resistance to four fungal diseases and associated genomic regions in a snap bean diversity panel

Anthracnose, white mold, powdery mildew, and root rot caused by Colletotrichum lindemuthianum, Scletorinia sclerotiorum, Erysiphe spp., and Pythium ultimum, respectively, are among the most frequent diseases that cause significant production losses worldwide in common bean (Phaseolus vulgaris L.). Reactions against these four fungal diseases were investigated under controlled conditions using a diversity panel of 311 bean lines for snap consumption (Snap bean Panel). The genomic regions involved in these resistance responses were identified based on a genome-wide association study conducted with 16,242 SNP markers. The highest number of resistant lines was observed against the three C. lindemuthianum isolates evaluated: 156 lines were resistant to CL124 isolate, 146 lines resistant to CL18, and 109 lines were resistant to C531 isolate. Two well-known anthracnose resistance clusters were identified, the Co-2 on chromosome Pv11 for isolates CL124 and CL18, and the Co-3 on chromosome Pv04 for isolates CL124 and C531. In addition, other lesser-known regions of anthracnose resistance were identified on chromosomes Pv02, Pv06, Pv08, and Pv10. For the white mold isolate tested, 24 resistant lines were identified and the resistance was localized to three different positions on chromosome Pv08. For the powdery mildew local isolate, only 12 resistant lines were identified, and along with the two previous resistance genes on chromosomes Pv04 and Pv11, a new region on chromosome Pv06 was also identified. For root rot caused by Pythium, 31 resistant lines were identified and two main regions were located on chromosomes Pv04 and Pv05. Relevant information for snap bean breeding programs was provided in this work. A total of 20 lines showed resistant or intermediate responses against four or five isolates, which can be suitable for sustainable farm production and could be used as resistance donors. Potential genes and genomic regions to be considered for targeted improvement were provided, including new or less characterized regions that should be validated in future works. Powdery mildew disease was identified as a potential risk for snap bean production and should be considered a main goal in breeding programs.

Impact of Web Blight on Photosynthetic Performance of an Elite Common Bean Line in the Western Amazon Region of Colombia

Disease stress caused by plant pathogens impacts the functioning of the photosynthetic apparatus, and the symptoms caused by the degree of severity of the disease can generally be observed in different plant parts. The accurate assessment of plant symptoms can be used as a proxy indicator for managing disease incidence, estimating yield loss, and developing genotypes with disease resistance. The objective of this work was to determine the response of the photosynthetic apparatus to the increased disease severity caused by web blight Thanatephorus cucumeris (Frank) Donk on the common bean (Phaseolus vulgaris L.) leaves under acidic soil and the humid tropical conditions of the Colombian Amazon. Differences in chlorophyll fluorescence parameters, including F_v/F_m, Y(II), Y(NPQ), Y(NO), ETR, qP, and qN in leaves with different levels of severity of web blight in an elite line (BFS 10) of common bean were evaluated under field conditions. A significant effect of web blight on the photosynthetic apparatus was found. A reduction of up to 50% of energy use dedicated to the photosynthetic machinery was observed, even at the severity scale score of 2 (5% surface incidence). The results from this study indicate that the use of fluorescence imaging not only allows for the quantifying of the impact of web blight on photosynthetic performance, but also for detecting the incidence of disease earlier, before severe symptoms occur on the leaves.

Chlorophyll Fluorescence Imaging as a Tool for Evaluating Disease Resistance of Common Bean Lines in the Western Amazon Region of Colombia

The evaluation of disease resistance is considered an important aspect of phenotyping for crop improvement. Identification of advanced lines of the common bean with disease resistance contributes to improved grain yields. This study aimed to determine the response of the photosynthetic apparatus to natural pathogen infection by using chlorophyll (Chl_a) fluorescence parameters and their relationship to the agronomic performance of 59 common bean lines and comparing the photosynthetic responses of naturally infected vs. healthy leaves. The study was conducted over two seasons under acid soil and high temperature conditions in the western Amazon region of Colombia. A disease susceptibility index (DSI) was developed and validated using chlorophyll a (Chl_a) fluorescence as a tool to identify Mesoamerican and Andean lines of common bean (Phaseolus vulgaris L.) that are resistant to pathogens. A negative effect on the functional status of the photosynthetic apparatus was found with the presence of pathogen infection, a situation that allowed the identification of four typologies based on the DSI values ((i) moderately resistant; (ii) moderately susceptible; (iii) susceptible; and (iv) highly susceptible). Moderately resistant lines, five of them from the Mesoamerican gene pool (ALB 350, SMC 200, BFS 10, SER 16, SMN 27) and one from the Andean gene pool (DAB 295), allocated a higher proportion of energy to photochemical processes, which increased the rate of electron transfer resulting in a lower sensitivity to disease stress. This photosynthetic response was associated with lower values of DSI, which translated into an increase in the accumulation of dry matter accumulation in different plant organs (leaves, stem, pods and roots). Thus, DSI values based on chlorophyll fluorescence response to pathogen infection could serve as a phenotyping tool for evaluating advanced common bean lines. Six common bean lines (ALB 350, BFS 10, DAB 295, SER 16, SMC 200 and SMN 27) were identified as less sensitive to disease stress under field conditions in the western Amazon region of Colombia, and these could serve as useful parents for improving the common bean for multiple stress resistance.

Delineating meta-quantitative trait loci for anthracnose resistance in common bean (Phaseolus vulgaris L.)

Anthracnose, caused by the fungus Colletotrichum lindemuthianum, is one of the devastating disease affecting common bean production and productivity worldwide. Several quantitative trait loci (QTLs) for anthracnose resistance have been identified. In order to make use of these QTLs in common bean breeding programs, a detailed meta-QTL (MQTL) analysis has been conducted. For the MQTL analysis, 92 QTLs related to anthracnose disease reported in 18 different earlier studies involving 16 mapping populations were compiled and projected on to the consensus map. This meta-analysis led to the identification of 11 MQTLs (each involving QTLs from at least two different studies) on 06 bean chromosomes and 10 QTL hotspots each involving multiple QTLs from an individual study on 07 chromosomes. The confidence interval (CI) of the identified MQTLs was found 3.51 times lower than the CI of initial QTLs. Marker-trait associations (MTAs) reported in published genome-wide association studies (GWAS) were used to validate nine of the 11 identified MQTLs, with MQTL4.1 overlapping with as many as 40 MTAs. Functional annotation of the 11 MQTL regions revealed 1,251 genes including several R genes (such as those encoding for NBS-LRR domain-containing proteins, protein kinases, etc.) and other defense related genes. The MQTLs, QTL hotspots and the potential candidate genes identified during the present study will prove useful in common bean marker-assisted breeding programs and in basic studies involving fine mapping and cloning of genomic regions associated with anthracnose resistance in common beans.