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For: Lee MW, Glosser R. Resistivity of Thin Films of the Palladium-Hydrogen System as a Function of Film Thickness*. Z PHYS CHEM 2011. [DOI: 10.1524/zpch.1986.147.1_2.027] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
Number Cited by Other Article(s)
1
Zhang WS, Zhang ZF, Zhang ZL. Some problems on the resistance method in the in situ measurement of hydrogen content in palladium electrode. J Electroanal Chem (Lausanne) 2002. [DOI: 10.1016/s0022-0728(02)00845-8] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022]
2
Volkening F, Naidoo M, Candela G, Holtz R, Provenzano V. Characterization of nanocrystalline palladium for solid state gas sensor applications. ACTA ACUST UNITED AC 1995. [DOI: 10.1016/0965-9773(95)00242-7] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/17/2022]
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