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For: Boone T, Nakahara S. A Technique for Preparing Transmission Electron Microscope Specimens Using Cleavage. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-115-81] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Number Cited by Other Article(s)
1
McCaffrey J. Small-angle cleavage of semiconductors for transmission electron microscopy. Ultramicroscopy 1991. [DOI: 10.1016/0304-3991(91)90116-n] [Citation(s) in RCA: 43] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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