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For: Ross FM, Gibson JM. High Energy Transmission Electron Diffraction From Surface Monolayers During Silicon Oxidation. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-208-55] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Number Cited by Other Article(s)
1
Xiao H, Daykin A. Extra diffractions caused by stacking faults in cubic crystals. Ultramicroscopy 1994. [DOI: 10.1016/0304-3991(94)90045-0] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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