Rajamani S, Korolev D, Belov A, Surodin S, Nikolitchev D, Okulich E, Mikhaylov A, Tetelbaum D, Kumar M. Effect of annealing on carrier transport properties of GaN-incorporated silicon.
RSC Adv 2016. [DOI:
10.1039/c6ra11261g]
[Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
GaN nanocrystals were formed in a silicon matrix by sequential implantation of Ga+ and N2+ ions followed by either Furnace Annealing (FA) or Rapid Thermal Annealing (RTA).
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