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For: He Z, Knoll GF, Wehe DK, Du YF. Direct Measurement of Electron Drift Parameters using Depth Sensing Single Carrier CdZnTe Detectors. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-487-89] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
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