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For: Gruverman A, Prakash SA, Aggarwal S, Ramesh R, Auciello O, Tokumoto H. Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-493-53] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]

For:	Gruverman A, Prakash SA, Aggarwal S, Ramesh R, Auciello O, Tokumoto H. Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-493-53] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]

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(The first 100,000 artilces are displayed in RCA.)